GRJ43DR72J104KWJ1L Datasheet, PDF (187/221 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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GORnl7y SfoerriCesamSpereaciFfilcaasthioCnisrcaunitdSTpeesctiMficeathtiodns and Test Methods
Continued from the preceding page.
No.
Item
Specifications
Test Method
Appearance No marking defects
Capacitance
Change
Within T15%
16 Life
D.F.
0.05 max.
I.R.
CU0.01µF: More than 10MΩ • µF
CF0.01µF: More than 1,000MΩ
Dielectric
Strength
In accordance with item No.4
Appearance No marking defects
Capacitance
Change
Within T15%
17
Humidity
Loading
D.F.
I.R.
0.05 max.
CU0.01µF: More than 10MΩ • µF
CF0.01µF: More than 1,000MΩ
Dielectric
Strength
In accordance with item No.4
Apply DC350V for 1,000^W Y⁴⁸ 0 hrs. at maximum operating
temperature T3D. Remove and let sit for 24T2 hrs. at room
condition,* then measure.
The charge/discharge current is less than 50mA.
#Pretreatment
Apply test voltage for 60T5 min. at test temperature.
Remove and let sit for 24T2 hrs. at room condition.*
Apply the rated voltage at 40T2D and relative humidity of 90 to
95% for 500Y ^{W20 4} hrs.
Remove and let sit for 24T2 hrs. at room condition,* then
measure.
#Pretreatment
Apply test voltage for 60T5 min. at test temperature.
Remove and let sit for 24T2 hrs. at room condition.*
* "Room condition" Temperature: 15 to 35D, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
186