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GRJ43DR72J104KWJ1L Datasheet, PDF (74/221 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors
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0. specifications before ordering.
GNM Series Specifications and Test Methods (1)
Continued from the preceding page.
When no "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (1).
When "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (2).
No.
Item
Temperature
Cycle
Specifications
Temperature
Compensating Type
High Dielectric Type
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
Within ±2.5%
Capacitance
or ±0.25pF
Change (whichever is
larger)
R7, R6, C7: Within ±7.5%
15
30pF min.: QU1000
Q/D.F.
30pF max.:
QU400+20C
Char. 25V min. 16V
R7, R6, 0.025 0.035
10V
0.035
6.3V
0.05
C:Nominal
C7
max. max. max. max.
Capacitance (pF)
I.R.
More than 10,000MΩ or 500Ω · F (whichever is smaller)
Dielectric
Strength
No failure
Humidity Steady
State
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
Within ±5%
Capacitance
or ±0.5pF
Change (whichever is
larger)
R7, R6, C7: Within ±12.5%
16
30pF and over:
QU350
10pF and over,
30pF and below:
Char. 25V min. 16V 10V/6.3V
Q/D.F.
QU275+5C/2 R7, R6, 0.05 0.05
0.05
10pF and below: C7
max. max.
max.
QU200+10C
C: Nominal
Capacitance (pF)
I.R.
More than 1,000MΩ or 50Ω · F (whichever is smaller)
Humidity Load
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
Within ±7.5%
Capacitance
or ±0.75pF
Change (whichever is
R7, R6, C7: Within ±12.5%
larger)
17
30pF and over:
QU200
30pF and below:
Char. 25V min. 16V 10V/6.3V
Q/D.F.
QU100+10C/3 R7, R6, 0.05
C7
max.
0.05
max.
0.05
max.
C: Nominal
Capacitance (pF)
I.R.
More than 500MΩ or 25Ω · F (whichever is smaller)
Test Method
Fix the capacitor to the supporting jig in the same manner and
under the same conditions as (10). Perform the five cycles
according to the four heat treatments listed in the following
table. Let sit for 24±2 hours (temperature compensating type)
or 48±4 hours (high dielectric constant type) at room
temperature, then measure.
Step
1
Min.
Temp. (°C) Operating
Temp.+0/–3
Time (min.) 30±3
2
Room
Temp.
2 to 3
3
Max.
Operating
Temp. +3/–0
30±3
4
Room
Temp.
2 to 3
• Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for one hour and
then let sit for 24±2 hours at room temperature.
Perform the initial measurement.
Set the capacitor at 40±2°C and 90 to 95% humidity for 500±12
hours.
Remove and let sit for 24±2 hours at room temperature, then
measure.
Apply the rated voltage at 40±2°C and 90 to 95% humidity for
500±12 hours.
Remove and let sit for 24±2 hours at room temperature, then
measure.
The charge/discharge current is less than 50mA.
Continued on the following page.
72