GRJ43DR72J104KWJ1L Datasheet, PDF (75/221 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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0. specifications before ordering.
GNM Series Specifications and TGesNtMMSetehroiedssS(1p)ecifications and Test Methods (1)
Continued from the preceding page.
When no "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (1).
When "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (2).
No.
Item
High Temperature
Load
Specifications
Temperature
Compensating Type
High Dielectric Type
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
Within ±3%
Capacitance
or ±0.3pF
Change (whichever is
larger)
R7, R6, C7: Within ±12.5%
18
30pF and over:
QU350
10pF and over,
30pF and below:
Char. 25V min. 16V 10V/6.3V
Q/D.F.
QU275+5C/2 R7, R6, 0.04 0.05
0.05
10pF and below: C7
max. max.
max.
QU200+10C
C: Nominal
Capacitance (pF)
I.R.
More than 1,000MΩ or 50Ω · F (whichever is smaller)
Test Method
Apply 200% of the rated voltage for 1000±12 hours at the
maximum operating temperature ±3°C. Let sit for 24±2 hours
at room temperature, then measure.
The charge/discharge current is less than 50mA.
• Initial measurement for high dielectric constant type.
Apply 200% of the rated DC voltage for one hour at the
maximum operating temperature ±3°C. Remove and let sit for
24±2 hours at room temperature. Perform initial
measurement.
Table A
Char.
5C
Nominal Values
(ppm/°C) *1
0±30
Max.
0.58
–55°C
Min.
–0.24
Capacitance Change from 25°C (%)
–30°C
Max.
Min.
0.40
–0.17
*1: Nominal values denote the temperature coefficient within a range of 25 to 125°C.
Max.
0.25
–10°C
Min.
–0.11
73