GRJ43DR72J104KWJ1L Datasheet, PDF (128/221 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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0. specifications before ordering.
GMD Series Specifications and Test Methods (2)
When no "*" is added in PNs table, please refer to GMD Series Specifications and Test Methods (1).
When "*" is added in PNs table, please refer to GMD Series Specifications and Test Methods (2).
No.
Item
Specifications
Test Method
Operating
1 Temperature
Range
R6 : –55°C to 85°C
2 Rated Voltage
See the previous pages.
3 Appearance
4 Dimensions
No defects or abnormalities.
Within the specified dimensions.
5 Dielectric Strength No defects or abnormalities.
6
Insulation
Resistance
7 Capacitance
More than 50Ω · F
Within the specified tolerance.
8
Dissipation
Factor (D.F.)
R6 : 0.1 max.
Reference Temperature : 25°C
The rated voltage is defined as the maximum voltage that may
be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V^P-P or V^O-P,
whichever is larger, should be maintained within the rated volt-
age range.
Visual inspection.
Using calipers.
No failure should be observed when 250% of the rated voltage
is applied between the terminations for 1 to 5 seconds, provid-
ed the charge/discharge current is less than 50mA.
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at normal temperature
and humidity and within 1 minutes of charging.
The capacitance/D.F. should be measured at reference
temperature at the frequency and voltage shown in the table.
Capacitance
CV10µF (10Vmin.)*¹
CV10µF (6.3Vmax.)
Frequency
1±0.1kHz
1±0.1kHz
Voltage
1.0±0.2Vrms
0.5±0.1Vrms
*1 GMD155 R6 1A 124 to 224 are applied to 0.5±0.1 Vrms.
The capacitance change should be measured after 5 min. at
each specified temp. stage.
Capacitance
9 Temperature No bias R6 : Within ±15% (–55°C to +85°C)
Characteristics
10
Mechanical
Strength
Bond
Strength
Pull force : 0.03N min.
Die Shear
Strength
Die Shear force : 2N min.
Appearance No defects or abnormalities.
11
Vibration
Resistance
Capacitance
Within the specified tolerance.
D.F.
R6 : 0.1 max.
The ranges of capacitance change compared with the
Reference Temperature value over the temperature ranges
shown in the table should be within the specified ranges.*
Step
1
2
3
4
Temperature (°C)
25±2
–55±3
25±2
85±3
*Initial measurement for high dielectric constant type
Perform a heat treatment at 150 +0/–10°C for one hour and
then let sit for 24±2 hours at room temperature.
Perform the initial measurement.
MIL-STD-883 Method 2011 Condition D
Mount the capacitor on a gold metallized alumina substrate with
Au-Sn (80/20) and bond a 25µm (0.001 inch) gold wire to the
capacitor terminal using an ultrasonic ball bond. Then, pull wire.
MIL-STD-883 Method 2019
Mount the capacitor on a gold metallized alumina substrate
with Au-Sn (80/20). Apply the force parallel to the substrate.
Ramp frequency from 10 to 55Hz then return to 10Hz all within
1 minute. Amplitude: 1.5 mm (0.06 inch) max. total excursion.
Apply this motion for a period of 2 hours in each of 3 mutually
perpendicular directions (total 6 hours).
Appearance No defects or abnormalities.
Capacitance
Change
R6 : Within ±7.5%
D.F.
12
Temperature
Sudden
I.R.
Change
R6 : 0.1 max.
More than 50Ω · F
Dielectric
Strength
No defects
The capacitor should be set for 24±2 hours at room
temperature after one hour of heat treatment at 150+0/–10°C,
then measure for the initial measurement. Fix the capacitor to
the supporting jig in the same manner and under the same
conditions as (11) and conduct the five cycles according to the
temperatures and time shown in the following table. Set it for
24±2 hours at room temperature, then measure.
Step
1
Min.
Temp. (°C) Operating
Temp.+0/–3
Time (min.) 30±3
2
Room
Temp.
2 to 3
3
Max.
Operating
Temp. +3/–0
30±3
4
Room
Temp.
2 to 3
Mounting for testing: The capacitors should be mounted on the substrate as shown below using die bonding. when tests No. 11 to 14 are performed.
Continued on the following page.
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