GRJ43DR72J104KWJ1L Datasheet, PDF (112/221 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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0. specifications before ordering.
GQM Series Specifications and Test Methods
Continued from the preceding page.
No.
Item
Specifications
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No defects or abnormalities.
Capacitance
17
Humidity
Load
Change
Q
Within T7.5% or T0.75pF
(whichever is larger)
30pF and over: QU200
30pF and below: QU100W10C/3
C: Nominal Capacitance (pF)
I.R.
More than 500MΩ
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No defects or abnormalities.
High
18 Temperature
Load
Capacitance
Change
Q
Within T3% or T0.3pF
(whichever is larger)
30pF and over: QU350
10pF and over, 30pF and below: QU275W5C/2
10pF and below: QU200W10C
Test Method
Apply the rated voltage at 40T2D and 90 to 95% humidity for
500T12 hours. Remove and let sit for 24T2 hours at room
temperature then measure. The charge/discharge current is
less than 50mA.
Apply 200%* of the rated voltage for 1000T12 hours at the
maximum operating temperature T3D.
Set for 24T2 hours at room temperature, then measure.
The charge/discharge current is less than 50mA.
*GQM22: 150% of the rated voltage
C: Nominal Capacitance (pF)
I.R.
More than 1,000MΩ
Table A
Char.
Nominal Values
(ppm/D) ^*1
Y55D
Max.
Min.
5C
0T30
0.58
Y0.24
*1: Nominal values denote the temperature coefficient within a range of 25 to 125D.
Capacitance Change from 25D (%)
Y30D
Max.
Min.
0.40
Y0.17
Max.
0.25
Y10D
Min.
Y0.11
110