TC1163 Datasheet, PDF (102/134 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller TriCore

TC1163/TC1164
Preliminary
Electrical Parameters
Table 4-6 ADC Characteristics (cont’d) (Operating Conditions apply)
Parameter
Symbol
ON resistance of R_AIN
the transmission
gates in the
analog voltage
path
Limit Values
Min. Typ. Max.
CC –
1
1.5
Unit Test Conditions /
Remarks
kΩ ⁹⁾
ON resistance for
the ADC test
(pull-down for
AIN7)
R_AIN7T
CC 200
300 1000 Ω
Test feature
available only for
AIN7
9)
Current through
resistance for the
ADC test (pull-
down for AIN7)
I_AIN7T
CC –
15 30 mA Test feature
rms peak
available only for
AIN7
9)
1) Voltage overshoot to 4 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
summary of the pulses does not exceed 1 h.
2) Voltage overshoot to 1.7 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
summary of the pulses does not exceed 1 h.
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
overshoot).
4) If the reference voltage V_AREF increases or the V_DDM decreases, so that V_AREF = ( V_DDM + 0.05 V to
V_DDM + 0.07 V), then the accuracy of the ADC decreases by 4LSB12.
5) If a reduced reference voltage in a range of V_DDM/2 to V_DDM is used, then the ADC converter errors increase.
If the reference voltage is reduced with the factor k (k<1), then TUE, DNL, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to V_DDM/2 is used, then there are additional decrease in the
ADC speed and accuracy.
6) Current peaks of up to 6 mA with a duration of max. 2 ns may occur
7) TUE is tested at V_AREF = 3.3 V, V_AGND = 0 V and V_DDM = 3.3 V
8) ADC module capability.
9) Not subject to production test, verified by design / characterization.
10) Value under typical application conditions due to integration (switching noise, etc.).
11) The sum of DNL/INL/Gain/Offset errors does not exceed the related TUE total unadjusted error.
12) For 10-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with factor 0.25.
For 8-bit conversions the DNL/INL/Gain/Offset error values must be multiplied with 0.0625.
13) The leakage current definition is a continuous function, as shown in Figure 4-3. The numerical values defined
determine the characteristic points of the given continuous linear approximation - they do not define step
function.
14) Only one of these parameters is tested, the other is verified by design characterization.
Data Sheet
98
V1.0, 2008-04