33742_08 Datasheet, PDF (7/70 Pages) Freescale Semiconductor, Inc – System Basis Chip with Enhanced High Speed CAN Transceiver

ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 4. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Rating
Symbol
Value
Unit
ELECTRICAL RATINGS
Power Supply Voltage at VSUP
Continuous (Steady-state)
Transient Voltage (Load Dump)
V_SUP
V
- 0.3 to 27
- 0.3 to 40
Logic Signals
(RXD, TXD, MOSI, MISO, CS, SCLK, RST, WDOG, and INT)
V_LOG
- 0.3 to V_DD + 0.3
V
Output Voltage at VDD
V_DD
0.0 to 5.3
V
Output Current at VDD
I_DD
Internally Limited
A
HS
Voltage
Output Current
ESD Capability, Human Body Model⁽¹⁾
MC33742 in 28-pin SOIC
HS, L0, L1, L2, L3, CANH, CANL pins
All Other pins
MC33742 in 48-pin QFN
All pins
V_HS
I_HS
V_ESD1
- 0.3 to V_SUP + 0.3
V
Internally Limited
A
V
± 4000
± 2000
± 2000
ESD Capability, Machine Model⁽¹⁾
V_ESD2
± 200
V
Input Voltage/Current at L0, L1, L2, L3
DC Input Voltage
DC Input Current
Transient Input Voltage attached to external circuitry⁽²⁾
V_DCIN
I_DCIN
V_TRINEC
- 0.3 to 40
V
± 2.0
mA
± 100
V
CANL and CANH
Continuous Voltage
Continuous Current
V_CANH/L
I_CANH/L
- 27 to 40
V
200
mA
CANH and CANL Transient Voltage (Load Dump)⁽³⁾
CANH and CANL Transient Voltage⁽³⁾
V_LDH/L
V_TRH/L
40
V
± 40
V
Notes
1. Testing done in accordance with the Human Body Model (C_ZAP=100pF, R_ZAP=1500Ω), Machine Model (C_ZAP=200pF, R_ZAP=0Ω).
2. Testing done in accordance with ISO 7637-1. See Figure 5.
3. Load dump testing done in accordance with ISO 7637-1, Transient test done in accordance with ISO 7637-1. See Figure 6.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33742
7