MC9S12C Datasheet, PDF (640/680 Pages) Motorola, Inc – 16-Bit Microcontroller

Appendix A Electrical Characteristics
A.1.6 ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-2. ESD and Latch-up Test Conditions
Model
Human Body
Description
Series Resistance
Storage Capacitance
Number of Pulse per pin
Machine
Series Resistance
Storage Capacitance
Number of Pulse per pin
Latch-up
Minimum input voltage limit
Maximum input voltage limit
Positive
Negative
Positive
Negative
Symbol
R1
C
—
—
R1
C
—
—
—
—
Value
1500
100
3
3
0
200
3
3
–2.5
7.5
Unit
Ohm
pF
Ohm
pF
V
V
Num
1
2
3
4
5
Table A-3. ESD and Latch-Up Protection Characteristics
C
Rating
C Human Body Model (HBM)
C Machine Model (MM)
C Charge Device Model (CDM)
Latch-up Current at 125°C
C
Latch-up Current at 27°C
C
Symbol
V_HBM
V_MM
V_CDM
Positive
I_LAT
Negative
Positive
I_LAT
Negative
Min
2000
200
500
+100
–100
+200
–200
Max
Unit
—
V
—
V
—
V
—
mA
—
—
mA
—
640
MC9S12C-Family / MC9S12GC-Family
Freescale Semiconductor
Rev 01.23