LSM9DS0 Datasheet, PDF (14/74 Pages) STMicroelectronics – iNEMO inertial module 3D accelerometer, 3D gyroscope, 3D magnetometer

Module specifications
LSM9DS0
Symbol
Table 3. Sensor characteristics (continued)
Parameter
Test conditions
Min. Typ.⁽¹⁾ Max. Unit
G_SoDr
Angular rate sensitivity
change vs. temperature
From -40 °C to +85 °C
Linear acceleration typical
LA_TyOff zero-g level offset
accuracy⁽³⁾⁽⁴⁾
Angular rate
G_TyOff
typical zero-rate level
FS = 245 dps
FS = 500 dps
FS = 2000 dps
LA_TCOff
Linear acceleration zero-g
level change vs. temperature
Max delta from 25 °C
G_TCOff
Zero-rate level change vs.
temperature
M_EF Maximum exposed field
No perming effect on zero
reading
M_DF Magnetic disturbing field
Sensitivity starts to degrade.
Automatic S/R pulse restores
the sensitivity⁽⁵⁾
±2
%
±60
mg
±10
±15
dps
±25
±0.5
mg/°C
±0.05
dps/°C
10000 gauss
20 gauss
LA_ST
Linear acceleration self-test
positive difference ⁽⁶⁾⁽⁷⁾
±2 g range, X, Y, Z-axis
AST1:0 = 01 see Table 74
60
FS = 245 dps
20
G_ST
Angular rate self-test output
change ⁽⁸⁾⁽⁹⁾
FS = 500 dps
70
FS = 2000 dps
150
Top Operating temperature range
-40
1700
mg
250
400
dps
1000
+85
°C
1. Typical specifications are not guaranteed
2. Verified by wafer level test and measurement of initial offset and sensitivity
3. Typical zero-g level offset value after MSL3 preconditioning
4. Offset can be eliminated by enabling the built-in high-pass filter
5. Set / Reset Pulse is automatically applied at each conversion cycle
6. “Self-test output change” is defined as: OUTPUT[mg]₍CTRL_REG2_XM (21h) _{AST1:0 enabled)} - OUTPUT[mg]₍CTRL_REG2_XM
(21h) _{AST1:0 disabled)}
7. For polarity refer to Table 77: Self-test mode configuration
8. “Self-test output change” is defined as: OUTPUT[mg]₍CTRL_REG4_G (23h) _{ST1:0 enabled)} - OUTPUT[mg]₍CTRL_REG4_G (23h)
ST1:0 disabled)
9. For polarity refer to Table 31: Self-test mode configuration
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