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SI5341 Datasheet, PDF (14/56 Pages) Silicon Laboratories – LOW-JITTER, 10-OUTPUT, ANY-FREQUENCY, ANY-OUTPUT CLOCK GENERATOR
Si5341/40
Table 8. Performance Characteristics
(VDD = 1.8 V ±5%, VDDA = 3.3 V ±5%, TA = –40 to 85 °C)
Parameter
VCO Frequency Range
PLL Loop Bandwidth
Initial Start-Up Time
POR1 to Serial Interface
Ready
PLL Lock Time6
Output Delay Adjustment
Jitter Generation
Locked to External Clock2
Symbol
FVCO
fBW
tSTART
tRDY
Test Condition
Time from power-up to when the
device generates clocks (Input
Frequency > 48 MHz)
tACQ
tDELAY_-
frac
tDELAY_int
tRANGE
JGEN
fIN = 19.44 MHz
fVCO = 14 GHz
Delay is controlled by the Multi-
Synth
Integer Mode3
12 kHz to 20 MHz
Fractional/DCO Mode4
12 kHz to 20 MHz
JPER
JCC
JPER
JCC
Derived from
integrated phase noise
N = 10,000 cycles
Integer or Fractional Mode3,4.
Measured in the time domain.
Performance is limited by the
noise floor of the
equipment.
Min
13.5
—
—
—
22
—
—
—
—
—
—
—
—
—
Typ Max
— 14.256
1.0
—
30
45
—
15
— 180
0.28 —
71.4
±9.14
0.135
—
—
0.175
0.160 0.205
0.140 —
0.250 —
7.3
—
8.1
—
Units
GHz
MHz
ms
ms
ms
ps
ps
ns
ps RMS
ps RMS
ps pk-pk
ps pk
ps pk-pk
ps pk
Notes:
1. Measured as time from valid VDD and VDD33 rails (90% of their value) to when the serial interface is ready to respond
to commands. Measured in SPI 4-wire mode, with SCLK @ 10 MHz.
2. Jitter generation test conditions fIN = 100 MHz, fOUT = 156.25 MHz LVPECL.
3. Integer mode assumes that the output dividers (Nn/Nd) are configured with an integer value.
4. Fractional and DCO modes assume that the output dividers (Nn/Nd) are configured with a fractional value and the
feedback divider is integer.
5. Initiate a soft reset command to align the outputs to within +/- 100 ps.
6. PLL lock time is measured by first letting the PLL lock, then turning off the input clock, and then turning on the input
clock. The time from the first edge of the input clock being re-applied until LOL de-asserts is the PLL lock time.
14
Rev. 1.0