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SI5341 Datasheet, PDF (12/56 Pages) Silicon Laboratories – LOW-JITTER, 10-OUTPUT, ANY-FREQUENCY, ANY-OUTPUT CLOCK GENERATOR | |||
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Si5341/40
Table 7. LVCMOS Clock Output Specifications
(VDD = 1.8 V ±5%, VDDA = 3.3 V ±5%, VDDO = 1.8 V ±5%, 2.5 V ±5%, or 3.3 V ±5%, TA = â40 to 85 °C)
Parameter
Symbol
Test Condition
Min Typ Max Units
Output Frequency
0.0001 â 250 MHz
Duty Cycle
DC
Output-to-Output Skew
TSK
Output Voltage High1, 2, 3 VOH
fOUT < 100 MHz
100 MHz < fOUT < 250 MHz
47
â
53
%
44
â
55
â
â 100 ps
VDDO = 3.3 V
OUTx_CMOS_DRV=1
IOH = â10 mA VDDO x â
â
V
OUTx_CMOS_DRV=2
IOH = â12 mA
0.75
â
â
OUTx_CMOS_DRV=3
IOH = â17 mA
ââ
VDDO = 2.5 V
OUTx_CMOS_DRV=1
IOH = â6 mA VDDO x â
â
V
OUTx_CMOS_DRV=2
IOH = â8 mA
0.75 â
â
OUTx_CMOS_DRV=3
IOH = â11 mA
ââ
VDDO = 1.8 V
OUTx_CMOS_DRV=2
OUTx_CMOS_DRV=3
IOH = â4 mA VDDO x â
â
IOH = â5 mA
0.75 â
â
V
Notes:
1. Driver strength is a register programmable setting and stored in NVM. Options are OUTx_CMOS_DRV = 1, 2, 3. Refer
to the Reference Manual for more details on register settings.
2. IOL/IOH is measured at VOL/VOH as shown in the dc test configuration.
3. A series termination resistor (Rs) is recommended to help match the source impedance to a 50 ï PCB trace. A 5 pF
capacitive load is assumed. The LVCMOS outputs were set to OUTx_CMOS_DRV = 3.
DC Test Configuration
Zs
VOL/VOH
IOL/IOH
IDDO
OUT
OUT
AC Test Configuration
Trace length 5 inches
499 ï
0.1 uF
50 ï
4.7 pF
56 ï
50 ïï probe, scope
50 ï
499 ï
4.7 pF
0.1 uF
56 ï
50 ïï probe, scope
12
Rev. 1.0
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