4509 Datasheet, PDF (141/142 Pages) Renesas Technology Corp – SINGLE-CHIP 4-BIT CMOS MICROCOMPUTER

REVISION HISTORY
4509 Group Data Sheet
Rev. Date
1.00 Mar. 18, 2005
1.01 Aug. 12, 2005
Page
–
17
52
57
58
62
130
131
1.02 Dec. 22, 2006 5
26
28
30
43
53
58
59 to 61
63
67 to 70
76
102
117
134
135
137
139
→
Description
Summary
First edition issued
ROM Code Protect Address added.
Table 20: Some description about Port P1 added.
Fig.52 revised.
Fig.54 revised.
“DATA REQUIRED FOR QzROM WRITING ORDERS” added.
Notes On ROM Code Protect added.
A/D converter characteristics:
Linearity error, Differential non-linearity error and Absolute accuracy
→ Parameters and Test conditions revised.
Voltage drop detection circuit characteristics: VRST-, VRST+ → Test conditions revised.
MULFUNCTION: Note 4 revised.
TIMER: Description revised and Structure of Timer 2 in Table 9 revised.
Fig.23: INSTCK (wrong) → INTSNC (correct)
(2) Prescaler: PRS → RPS
(3) Timer 3 → Timer 1
SERIAL I/O: Table 14: Note revised.
Fig. 46: Notes revised.
Table 23: Changes referring ahead and note 5 added.
QzROM Writing Mode added.
LIST OF PRECAUTIONS: Mulfunction revised.
NOTES ON NOISE added.
Description of Port output structure control register FR2 and FR3 revised.
Instruction code of TAL1 revised. Description of TALA revised.
Detailed description of TEAB revised.
f(SCK): Serial interface external input frequency →
Serial interface external input period
∆ f(XIN): Ta = around 25 °C → center 25 °C
Figure title revised, “When ceramic resonator is used” deleted.
Note 4: (power current) → (supply current)
Pages 79–81, 93–95, 114, 122–129:
Description of SNZ0, SNZT1, SNZT2, SNZAD, SNZSI and WRST instructions revised.
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