JN516X Datasheet, PDF (48/94 Pages) NXP Semiconductors – IEEE802.15.4 Wireless Microcontroller

14 JTAG Test Interface
The JN516x includes an IEEE1149.1 compliant JTAG port for the purpose of manufacturing test. The software
debugger is not supported with this product.
The JTAG interface does not support boundary scan testing. It is recommended that the JN516x is not connected as
part of the board scan chain.
JN5142 includes an IEEE1149.1 compliant JTAG port for the purpose of manufacturing test. The software debugger
is not supported with this product.
The JTAG interface does not support boundary scan testing. It is recommended that the JN5142 is not connected as
part of the board scan chain.
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JN-DS-JN516x v1.1 Production
© NXP Laboratories UK 2013