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DS1035 Datasheet, PDF (76/106 Pages) Dallas Semiconductor – 3-in-1 High.Speed Silicon Delay Line
DC and Switching Characteristics
MachXO2 Family Data Sheet
Switching Test Conditions
Figure 3-13 shows the output test load used for AC testing. The specific values for resistance, capacitance, volt-
age, and other test conditions are shown in Table 3-5.
Figure 3-13. Output Test Load, LVTTL and LVCMOS Standards
VT
R1
DUT
Test Poi nt
CL
Table 3-5. Test Fixture Required Components, Non-Terminated Interfaces
Test Condition
R1
CL
Timing Ref.
VT
LVTTL, LVCMOS 3.3 = 1.5V
—
LVCMOS 2.5 = VCCIO/2
—
LVTTL and LVCMOS settings (L -> H, H -> L)

0pF LVCMOS 1.8 = VCCIO/2
—
LVCMOS 1.5 = VCCIO/2
—
LVCMOS 1.2 = VCCIO/2
—
LVTTL and LVCMOS 3.3 (Z -> H)
1.5
VOL
LVTTL and LVCMOS 3.3 (Z -> L)
1.5
VOH
Other LVCMOS (Z -> H)
188
0pF
VCCIO/2
VOL
Other LVCMOS (Z -> L)
VCCIO/2
VOH
LVTTL + LVCMOS (H -> Z)
VOH - 0.15
VOL
LVTTL + LVCMOS (L -> Z)
VOL - 0.15
VOH
Note: Output test conditions for all other interfaces are determined by the respective standards.
3-37