SAM4L_14 Datasheet, PDF (72/176 Pages) ATMEL Corporation – Technology for Ultra-low Power Consumption

ATSAM4L8/L4/L2
8.7.12
JTAG Instructions Summary
The implemented JTAG instructions are shown in the table below.
Table 8-2. Implemented JTAG instructions list
IR instruction
value
Instruction
Description
availability
when
protected
Component
b0000
EXTEST
Select boundary-scan chain as data register for
testing circuitry external to
yes
the device.
b0001
SAMPLE_PRELOAD
Take a snapshot of external pin values without
affecting system operation.
yes
b0100
INTEST
Select boundary-scan chain for internal testing of the
device.
yes
b0101
CLAMP
Bypass device through Bypass register, while driving
outputs from boundary-scan register.
yes
BSCAN-TAP
b1000
ABORT
ARM JTAG-DP Instruction
yes
b1010
DPACC
ARM JTAG-DP Instruction
yes
b1011
b1100
b1101
APACC
-
-
ARM JTAG-DP Instruction
Reserved
Reserved
yes
SWJ-DP
yes
(in JTAG mode)
yes
b1110
IDCODE
ARM JTAG-DP Instruction
yes
b1111
BYPASS
Bypass this device through the bypass register.
yes
72
42023GS–SAM–03/2014