SM320VC5510A-EP Datasheet, PDF (48/82 Pages) Texas Instruments – SM320VC5510A-EP Fixed-Point Digital Signal Processor

Electrical Specifications
Tester Pin _VLoad
Electronics
IOL-test
50 Ω
C_T
Output
Under
Test
IOH-test
Where:
IOL-test ₌
IOH-test ₌
VLoad ₌
CT
=
+2 mA (all outputs)
−2 mA (all outputs)
50% of DVdd
15 pF typical load circuit capacitance.
Figure 5−1. 3.3-V Test Load Circuit
5.4 Package Thermal Resistance Characteristics
Table 5−1 provides the thermal resistance characteristics for the recommended package types used on the
320VC5510 DSP.
Table 5−1. Thermal Resistance Characteristics (Ambient)
R_ΘJA (°C / W)
BOARD TYPE^†
AIRFLOW (LFM)
26
High-K
0
22
High-K
150
20
High-K
250
50
Low-K
0
35
Low-K
150
29
Low-K
250
† _{Board types are as defined by JEDEC. Reference JEDEC Standard JESD51-9, Test Boards for Area Array Surface Mount Package Thermal}
Measurements.
Table 5−2. Thermal Resistance Characteristics (Case)
R_ΘJC (°C / W)
BOARD TYPE^†
6
2s JEDEC Test Card
† _{Board types are as defined by JEDEC. Reference JEDEC Standard JESD51-9, Test Boards for Area Array Surface Mount Package Thermal}
Measurements.
40 SGUS045A
August 2003 − Revised November 2003