TCM4400 Datasheet, PDF (21/72 Pages) Texas Instruments – GSM/DCS BASEBAND AND VOICE A/D AND D/A RF INTERFACE CIRCUIT

2.7.3 APC Output Stage
PARAMETER
TEST CONDITIONS
MIN TYP MAX
Output voltage at shape = 3 and
level = 255 (AVDD3 _/5 = 3 V)
Output voltage at shape = 31 and
level = 255 (AVDD3 _/5 = 5 V)
Output voltage at shape = 0 and
level = xx (AVDD3 _/5 = 3 V)
Output voltage at shape = 0 and
level = xx (AVDD3 _/5 = 5 V)
Ouptut voltage at shape = 0 and
level = xx (AVDD3 _/5 = 3 V)†
Output voltage at shape = 0 and
level = xx (AVDD3 _/5 = 5 V)†
Output voltage at shape = xx and
level = 0
Bit APCSWG = 0
2 2.2 2.4
Bit APCSWG = 1
4 4.4 4.8
Bit APCSWG = 0, Bit APCMODE = 0
0
15
Bit APCSWG = 1, Bit APCMODE = 0
0
30
Bit APCSWG = 0, Bit APCMODE = 1
80 120 160
Bit APCSWG = 1, Bit APCMODE = 1 160 240 320
0
5
Output voltage in power down
0
DC power supply sensitivity
1
Output impedance in power down
20
Load resistance
10
Load capacitance
50
† _{Temperature variations of these voltages are ± 1% from – 50°C to +100°C and ± 0.6% from 0°C to 70°C.}
2.8 Monitoring ADC
2.8.1 10-bit ADC
PARAMETER
TEST CONDITIONS
Integral nonlinearity (best fitting)
Differential nonlinearity
Conversion time‡
Input signal range < 0.95 VVREF
Input signal range < 0.95 VVREF
Input range
Input leakage current
Input capacitance
‡ _{Value given is for system information only.}
MIN TYP MAX
–4
4
–2
2
10
0
VVREF
– 10
10
25
2.9 Automatic Gain Control (AGC)
2.9.1 AGC 10-bit DAC
PARAMETER
Integral nonlinearity
Differential nonlinearity
Settling time
TEST CONDITIONS
Best fitting line
From AUXAGC load
MIN TYP MAX
–1
1
–1
1
100
UNIT
V
V
mV
mV
mV
mV
mV
V
%
Ω
kΩ
pF
UNIT
LSB
LSB
µs
V
µA
pF
UNIT
LSB
LSB
µs
2–7