PIC32MX575F256H-80I Datasheet, PDF (176/236 Pages) Microchip Technology – High-Performance, USB, CAN and Ethernet 32-Bit Flash Microcontrollers

PIC32MX5XX/6XX/7XX
TABLE 31-8: DC CHARACTERISTICS: I/O PIN INPUT SPECIFICATIONS
DC CHARACTERISTICS
Standard Operating Conditions: 2.3V to 3.6V (unless otherwise
stated)
Operating temperature -40°C  TA  +85°C for Industrial
Param.
No.
Symbol
Characteristics
Min.
Typical⁽¹⁾ Max. Units
Conditions
VIL
Input Low Voltage
DI10
I/O Pins:
with TTL Buffer
VSS
— 0.15 VDD V (Note 4)
with Schmitt Trigger Buffer
VSS
—
0.2 VDD V (Note 4)
DI15
MCLR⁽²⁾
VSS
—
0.2 VDD V (Note 4)
DI16
OSC1 (XT mode)
VSS
—
0.2 VDD V (Note 4)
DI17
OSC1 (HS mode)
VSS
—
0.2 VDD V (Note 4)
DI18
SDAx, SCLx
VSS
—
0.3 VDD V SMBus disabled
(Note 4)
DI19
SDAx, SCLx
VSS
—
0.8
V SMBus enabled
(Note 4)
VIH
Input High Voltage
DI20
I/O Pins:
with Analog Functions
0.8 VDD
—
VDD
V (Note 4)
Digital Only
0.8 VDD
—
V (Note 4)
with TTL Buffer
0.25 VDD + 0.8V —
5.5
V (Note 4)
with Schmitt Trigger Buffer
0.8 VDD
—
5.5
V (Note 4)
DI25
MCLR⁽²⁾
0.8 VDD
—
VDD
V (Note 4)
DI26
OSC1 (XT mode)
0.7 VDD
—
VDD
V (Note 4)
DI27
OSC1 (HS mode)
0.7 VDD
—
VDD
V (Note 4)
DI28
SDAx, SCLx
0.7 VDD
—
5.5
V SMBus disabled
(Note 4)
DI29
SDAx, SCLx
2.1
—
5.5
V SMBus enabled,
2.3V  VPIN  5.5
(Note 4)
DI30 ICNPU CNxx Pull up Current
50
250
400
A VDD = 3.3V, VPIN = VSS
IIL
Input Leakage Current
(Note 3)
DI50
I/O Ports
—
—
+1
A VSS  VPIN  VDD,
Pin at high-impedance
DI51
Analog Input Pins
—
—
+1
A VSS  VPIN  VDD,
Pin at high-impedance
DI55
MCLR⁽²⁾
—
—
+1
A VSS VPIN VDD
DI56
OSC1
—
—
+1
A VSS VPIN VDD,
XT and HS modes
Note 1: Data in “Typical” column is at 3.3V, 25°C unless otherwise stated. Parameters are for design guidance only
and are not tested.
2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified
levels represent normal operating conditions. Higher leakage current may be measured at different input
voltages.
3: Negative current is defined as current sourced by the pin.
4: This parameter is characterized, but not tested in manufacturing.
DS61156C-page 176
Preliminary
 2010 Microchip Technology Inc.