AMIS-53050 Datasheet, PDF (103/107 Pages) AMI SEMICONDUCTOR – Frequency Agile Transceiver

AMIS-53050 Frequency Agile Transceiver
Data Sheet
9.2.12. Digital Test MUX C
This register allows test signals to be routed to the indicated pins of the AMIS-53050. These signals can help in the development of an
application using the AMIS-53050. The test unlock register code must be written, then this test register is written and then the test
function will be enabled until either is changed or there is a reset of the AMIS-53050, even if the test unlock register code value is
changed.
Table 118: Digital Test MUX C - 0X4D [77]
Bit Test Pin
Comment
7:4 ^{MUX to}
Data SSN
1111 - 0000
3:0 Reserved
1111- 0000
1111
1110
1101
1100
1011
1010
1001
1000
1111
1110
1101
1100
1011
1010
1001
1000
Undefined
Undefined
EE BIST good
AM Filter Clock
CPENA
ROM BIST done
ROM BIST bad
RAM BIST done
Undefined
Undefined
Undefined
Undefined
Undefined
Undefined
Undefined
Undefined
0111
0110
0101
0100
0011
0010
0001
0000
0111
0110
0101
0100
0011
0010
0001
0000
RAM BIST bad
EE BIST done
EE BIST bad
Busy
Instruction enable
Bandgap power down
XTAL
DSSN
Undefined
Undefined
Undefined
Undefined
Undefined
Undefined
Undefined
Undefined
9.2.13. Digital Test Mode A
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.14. Digital Test Mode B
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.15. Digital Test Mode C
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.16. Digital Test Mode D
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.17. Memory Test Mode Address
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.18. Memory Test Mode Data
This register is used for factory testing of the AMIS-53050 and has no user functions.
AMI Semiconductor – Jan. 07, M-20639-002
103
www.amis.com