AMIS-53050 Datasheet, PDF (101/107 Pages) AMI SEMICONDUCTOR – Frequency Agile Transceiver

AMIS-53050 Frequency Agile Transceiver
Data Sheet
9.2.5. Power Down RF Sections
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.6. Analog Test Mode
Digital Pad Test: All digital pads except system clock out, and xInterrupt are 1mA I/O with pull ups and Schmitt triggers. The
SYSclock and xInterrupt pads are 2mA outputs.
Auto Increment Disable: This disables the automatic incrementing of the I²C register addresses. It can allow repeated writes
to the same register, useful for adjusting a parameter to optimize its value.
Table 115: Analog Test Mode - 0X47 [71]
Bit Name
State Comment
7 CAP_TRIM
1
Enable the test mode for determination of capacitance trim value
0
6
Pipe ADC1 to data
filter
1
0
Enable the ADC1 input channel as a direct input to the data filter
Normal operation
5
Brown-out power
down
1
0
Override the brown-out POR to allow test at any voltage
4
Auto increment
Disable
1
0
Address increment disabled (IIC only)
3 Dither mode
1
Dither is applied to the sigma-delta circuits in the PLL
0
1
2 Ignore XTAL control
0
Ignore crystal control (digital clock gating)
Enabled:
1
1 Dig pad test A
0 Dig pad test B
0
Disabled
Enabled:
1
0
Disabled
9.2.7. RF Test Modes
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.8. Analog Test MUX
This register is used for factory testing of the AMIS-53050 and has no user functions.
9.2.9. RF Test MUX
This register is used for factory testing of the AMIS-53050 and has no user functions.
AMI Semiconductor – Jan. 07, M-20639-002
101
www.amis.com