THS3217 Datasheet, PDF (9/73 Pages) Texas Instruments – THS3217 DC to 800-MHz, Differential-to-Single-Ended, DAC Output Amplifier

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THS3217
SBOS766B – FEBRUARY 2016 – REVISED FEBRUARY 2016
7.7 Electrical Characteristics: D2S + OPS
at +V_CC = 6.0 V, –V_CC = –6.0 V, 25-Ω D2S source impedance, D2S input V_IC = 0.25 V, Internal path selected to OPS
(PATHSEL ≤ 0.7 V or floated), V_REF = GND, combined A_V = 5 V/V, D2S R_LOAD= 200 Ω, R_F = 249 Ω⁽¹⁾, R_G = 162 Ω (OPS A_V =
2.5 V/V), OPS enabled (DISABLE ≤ 0.7 V or floated), OPS R_LOAD = 100 Ω, and T_J ≈ 25˚C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TEST
MIN
TYP
MAX UNIT LEVEL
(2)
AC PERFORMANCE⁽³⁾
Small-signal bandwidth (SSBW)
Large-signal bandwidth (LSBW)
Bandwidth for 0.2-dB flatness
Slew rate⁽⁴⁾
Over- and undershoot
Rise and fall time
Settling time to 0.1%
2nd-order harmonic distortion (HD2)
3rd-order harmonic distortion (HD3)
Output voltage noise
DC PERFORMANCE⁽³⁾
V_OUT = 100 mV_PP, peaking < 1.5 dB
V_OUT = 5 V_PP
V_OUT = 2 V_PP
V_OUT = 8-V step
Input t_r = 1 ns, V_OUT = 5-V step
Input t_r = 1 ns, V_OUT = 5-V step
Input t_r = 1 ns, V_OUT = 5-V step
f = 20 MHz, V_OUT= 5 V_PP
f = 20 MHz, V_OUT= 5 V_PP
f > 200 kHz
800
500
100
5000
8%
1.1
7
–60
–75
45
MHz
C
MHz
C
MHz
C
V/µs
C
C
ns
C
ns
C
dBc
C
dBc
C
nV/√Hz
C
Total gain D2S to OPS output⁽¹⁾
0.1% tolerance, dc, ±100-mV output
test
4.92
5.02
5.12 V/V
A
POWER SUPPLY (Combined D2S, OPS, and Midscale Reference Buffer)
Bipolar-supply operating range
±4.0
±6.0
±7.9
V
A
Single-supply operating range
8
12
15.8
V
B
Supply current
±6-V supplies
51
54
57 mA
A
Supply current temperature
coefficient
10
µA/°C
C
(1) Output power stage includes an internal 18.5-kΩ feedback resistor. This internal resistor, in parallel with an external 249-Ω R_F and 162-
Ω R_G, results in a gain of 2.5 V/V after including a nominal gain loss of 0.9935 V/V due to the input buffer and loop-gain effects.
(2) Test levels (all values set by characterization and simulation): (A) 100% tested at T_A≈ T_J≈ 25°C; over temperature limits by
characterization and simulation. (B) Not tested in production; limits set by characterization and simulation. (C) Typical value only for
information.
(3) Output measured at pin 11.
(4) This slew rate is the average of the rising and falling time estimated from the large-signal bandwidth as: (Vpeak / √2) × 2π × f_–3dB.
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