THS3217 Datasheet, PDF (27/73 Pages) Texas Instruments – THS3217 DC to 800-MHz, Differential-to-Single-Ended, DAC Output Amplifier

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THS3217
SBOS766B – FEBRUARY 2016 – REVISED FEBRUARY 2016
Feedthrough Measurement (continued)
In order to test the reverse feedthrough performance of the OPS in its disabled state, the circuit shown in
Figure 74 was used. The PATHSEL pin was driven high to select the external path to the OPS noninverting pin,
VIN+. A 100-mV_PP, swept-frequency, sinusoidal signal was applied at the VIN+ pin and the output signal was
measured at the D2S output pin (VO1). The results shown in Figure 58 account for the 16.5-dB loss due to the
D2S termination, and the test reports the reverse feedthrough between the VO1 and VIN+ pins. The D2S inputs
were grounded through 50-Ω resistors for this test.
16
15
14
50 k
1
100
x1
50 k
50
2 x1
49.9
+
250
500
3 x1
49.9
4
PATHSEL = High
5
6
7
VO1
169
13
12
18.5 k
11
162 Ÿ
249 Ÿ
18.5 k
DISABLE = High
10
VIN+
9
49.9
8
100
Network
Analyzer
GND Port 1
50
Port 2
50
73.2
Figure 74. Reverse-Feedthrough Test Circuit
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