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MSP430FR6889 Datasheet, PDF (70/176 Pages) Texas Instruments – Mixed-Signal Microcontrollers
MSP430FR6889, MSP430FR68891, MSP430FR6888, MSP430FR6887
MSP430FR5889, MSP430FR58891, MSP430FR5888, MSP430FR5887
SLASE32A – AUGUST 2014 – REVISED MARCH 2015
www.ti.com
5.13.5.9 FRAM Controller
Table 5-42. FRAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
Read and write endurance
TEST
CONDITIONS
MIN
1015
TYP MAX UNIT
cycles
tRetention Data retention duration
IWRITE
IERASE
tWRITE
tREAD
Current to write into FRAM
Erase current
Write time
Read time, NWAITSx=0
Read time, NWAITSx=1
TJ = 25°C
TJ = 70°C
TJ = 85°C
100
40
10
IREAD (1)
n/a (2)
tREAD (3)
1/fSYSTEMS (4)
2/fSYSTEMS (4)
years
nA
nA
ns
ns
ns
(1) Writing to FRAM does not require a setup sequence or additional power when compared to reading from FRAM. The FRAM read
current IREAD is included in the active mode current consumption numbers IAM,FRAM.
(2) FRAM does not require a special erase sequence.
(3) Writing into FRAM is as fast as reading.
(4) The maximum read (and write) speed is specified by fSYSTEMS using the appropriate wait state settings (NWAITSx).
5.13.6 Emulation and Debug
Table 5-43. JTAG and Spy-Bi-Wire Interface
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST
CONDITIONS
MIN
TYP MAX UNIT
IJTAG
fSBW
tSBW,Low
tSBW, En
Supply current adder when JTAG active (but not clocked)
Spy-Bi-Wire input frequency
Spy-Bi-Wire low clock pulse duration
Spy-Bi-Wire enable time (TEST high to acceptance of first clock
edge) (1)
2.2 V, 3.0 V
2.2 V, 3.0 V
0
2.2 V, 3.0 V 0.04
2.2 V, 3.0 V
40 100 μA
10 MHz
15 μs
110 μs
tSBW,Rst
fTCK
Spy-Bi-Wire return to normal operation time
TCK input frequency - 4-wire JTAG(2)
15
2.2 V
0
3.0 V
0
100 μs
16 MHz
16 MHz
Rinternal
fTCLK
tTCLK,Low/High
fTCLK,FRAM
tTCLK,FRAM,Low/High
Internal pulldown resistance on TEST
TCLK/MCLK frequency during JTAG access, no FRAM access
(limited by fSYSTEM)
TCLK low or high clock pulse duration, no FRAM access
TCLK/MCLK frequency during JTAG access, including FRAM access
(limited by fSYSTEM with no FRAM wait states)
TCLK low or high clock pulse duration, including FRAM accesses
2.2 V, 3.0 V
20
35
50 kΩ
16 MHz
25 ns
4 MHz
100 ns
(1) Tools accessing the Spy-Bi-Wire interface need to wait for the tSBW,En time after pulling the TEST/SBWTCK pin high before applying the
first SBWTCK clock edge.
(2) fTCK may be restricted to meet the timing requirements of the module selected.
70
Specifications
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