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SM320C6727B-EP Datasheet, PDF (33/109 Pages) Texas Instruments – Floating-Point Digital Signal Processor
SM320C6727B-EP
www.ti.com
SPRS793A – SEPTEMBER 2011 – REVISED OCTOBER 2011
4.4 Electrical Characteristics
Over Operating Case Temperature Range (Unless Otherwise Noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX UNIT
VOH
VOL
IOH
IOL
VIH
VIL
VHYS
II, IOZ
High Level Output Voltage
Low Level Output Voltage
High-Level Output Current
Low-Level Output Current
High-Level Input Voltage
Low-Level Input Voltage
Input Hysterisis
Input Current and Off State Output
Current
IO = –100 µA
IO = 100 µA
VO = 0.8 DVDD
VO = 0.22 DVDD
Pins without pullup or pulldown
Pins with internal pullup
DVDD – 0.2
2
0
0.13 DVDD
–50
V
0.2
V
–8 mA
8 mA
DVDD
V
0.8
V
V
±10
–170
µA
Pins with internal pulldown
50
170
ttr
CI
CO
IDD2V
IDD3V
Input Transition Time
Input Capacitance
Output Capacitance
CVDD Supply(1)
DVDD Supply(1)
Capacitance = 7 pF,
CVDD = 1.2 V,
658 CPU clock = 250 MHz
DVDD = 3.3 V,
32-bit EMIF speed = 100 MHz
25
ns
7
pF
7
pF
555
mA
58
mA
(1) Assumes the following conditions: 25°C case temperature; 60% CPU utilization; EMIF at 50% utilization (100 MHz), 50% writes,
(32 bits), 50% bit switching; two 10-MHz SPI at 100% utilization, 50% bit switching.
The actual current draw is highly application-dependent. For more details on core and I/O activity, refer to the TMS320C672x Power
Consumption Summary Application Report (literature number SPRAAA4).
SPACER
1000000
100000
10000
Electromigration Fail Mode
1000
80
90 100 110 120 130 140 150 160
Continuous Junction Temperature (°C)
G001
(1) See the absolute maximum ratings and the recommended operating conditions.
(2) Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect life).
(3) The predicted operating lifetime vs junction temperature is based on reliability modeling using electromigration as the dominant
failure mechanism affecting device wearout for the specific device process and design characteristics.
Figure 4-1. SM320C6727B-EP Operating Life Derating Chart
Copyright © 2011, Texas Instruments Incorporated
Peripheral and Electrical Specifications
33
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