RX63N_15 Datasheet, PDF (182/210 Pages) Renesas Technology Corp – Renesas MCUs

RX63N Group, RX631 Group
5. Electrical Characteristics
5.5 A/D Conversion Characteristics
Table 5.28 10-Bit A/D Conversion Characteristics
Conditions: VCC = AVCC0 = VREFH = VCC_USB = 2.7 to 3.6 V, VREFH0 = 2.7 V to AVCC0
VSS = AVSS0 = VREFL/VREFL0 = VSS_USB = 0 V
PCLK = 8 to 50 MHz
T_a = T_opr
Item
Min.
Typ.
Resolution
—
—
Conversion With 0.1-µF
When the capacitor is charged enough*² 3.0 (2.5)*³ —
time*¹
external
(Operation at capacitor
PCLK = 50
MHz)
Without 0.1-µF Permissible signal source
1.5 (1.0)*³ —
external
impedance (max.) = 1.0 kΩ, VCC  3.0 V
capacitor
Permissible signal source
3.5 (3.0)*³ —
impedance (max.) = 1.0 kΩ, VCC  2.7 V
Permissible signal source
2.0 (1.5)*³ —
impedance (max.) = 5.0 kΩ, VCC  3.0 V
Permissible signal source
4.0 (3.5)*³ —
impedance (max.) = 5.0 kΩ, VCC  2.7 V
Analog input capacitance
Offset error
Full-scale error
Quantization error
Absolute accuracy
DNL differential nonlinearity error
INL integral nonlinearity error
—
—
—
±1.5
—
±1.5
—
±0.5
—
±1.5
—
±0.5
—
±1.5
Max.
10
—
—
—
—
—
6.0
±3.0
±3.0
—
±3.0
±1.0
±3.0
Unit
Test
Conditions
Bit
µs Sampling
in 125
states
Sampling
in 50
states
Sampling
in 150
states
Sampling
in 75
states
Sampling
in 175
states
pF
LSB
LSB
LSB
LSB
LSB
LSB
Note: The above specification values apply when there is no access to the external bus during A/D conversion. If access proceeds
during A/D conversion, values may not fall within the above ranges.
Note 1. The conversion time includes the sampling time and the comparison time. As the test conditions, the number of sampling states
is indicated.
Note 2. The scanning is not supported.
Note 3. The value in parentheses indicates the sampling time.
R01DS0098EJ0180 Rev.1.80
May 13, 2014
Page 182 of 208