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PIC18F2585_07 Datasheet, PDF (428/482 Pages) Microchip Technology – Enhanced Flash Microcontrollers with ECAN Technology, 10-Bit A/D and nanoWatt Technology
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PIC18F2585/2680/4585/4680
27.3 DC Characteristics: PIC18F2585/2680/4585/4680 (Industrial)
PIC18LF2585/2680/4585/4680 (Industrial)
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise stated)
Operating temperature -40°C ≤ TA ≤ +85°C for industrial
Param
No.
Symbol
Characteristic
Min
Max Units
Conditions
VIL
Input Low Voltage
I/O ports:
D030
with TTL buffer
VSS
0.15 VDD V VDD < 4.5V
D030A
—
0.8
V 4.5V ≤ VDD ≤ 5.5V
D031
D031A
D031B
with Schmitt Trigger buffer
RC3 and RC4
VSS
0.2 VDD V
VSS
0.3 VDD V I2C™ enabled
VSS
0.8
V SMBus enabled
D032
MCLR
VSS
0.2 VDD V
D033
D033A
OSC1
OSC1
VSS
0.3 VDD V HS, HSPLL modes
VSS
0.2 VDD V RC, EC modes(1)
D033B
OSC1
VSS
0.3
V XT, LP modes
D034
T13CKI
VSS
0.3
V
VIH Input High Voltage
I/O ports:
D040
with TTL buffer
0.25 VDD + 0.8V VDD
V VDD < 4.5V
D040A
2.0
VDD
V 4.5V ≤ VDD ≤ 5.5V
D041
D041A
D041B
with Schmitt Trigger buffer
RC3 and RC4
0.8 VDD
0.7 VDD
2.1
VDD
V
VDD
V I2C™ enabled
VDD
V SMBus enabled
D042
MCLR
0.8 VDD
VDD
V
D043
OSC1
0.7 VDD
VDD
V HS, HSPLL modes
D043A
D043B
OSC1
OSC1
0.8 VDD
0.9 VDD
VDD
V EC mode
VDD
V RC mode(1)
D043C
OSC1
1.6
VDD
V XT, LP modes
D044
IIL
T13CKI
Input Leakage Current(2,3)
1.6
VDD
V
D060
I/O ports
—
±1
μA VSS ≤ VPIN ≤ VDD,
Pin at high-impedance
D061
MCLR
—
±5
μA Vss ≤ VPIN ≤ VDD
D063
OSC1
—
±5
μA Vss ≤ VPIN ≤ VDD
IPU
Weak Pull-up Current
D070 IPURB PORTB weak pull-up current
50
400
μA VDD = 5V, VPIN = VSS
Note 1: In RC oscillator configuration, the OSC1/CLKI pin is a Schmitt Trigger input. It is not recommended that the
PIC® device be driven with an external clock while in RC mode.
2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified
levels represent normal operating conditions. Higher leakage current may be measured at different input
voltages.
3: Negative current is defined as current sourced by the pin.
4: Parameter is characterized but not tested.
DS39625C-page 426
Preliminary
© 2007 Microchip Technology Inc.
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