PXS30 Datasheet, PDF (88/139 Pages) Freescale Semiconductor, Inc – PXS30 Microcontroller

Electrical characteristics
Table 27. Flash module life
No. Symbol
Parameter
Condition
Value
Unit
Min Typ¹ Max
1a P/E CC Number of program/erase 16 KB blocks
1b
cycles per block for over the
operating temperature range
32 KB and 64 KB blocks
1c
(T_J)
128 KB blocks
100,000 —
— cycles
10,000 100,000 — cycles
1,000 100,000 — cycles
2 Retention CC Minimum data retention at Blocks with 0–1,000
20
—
— years
85 °C average ambient
temperature²
P/E cycles
Blocks with 1,001–10,000
10
—
— years
P/E cycles
Blocks with 10,001–100,000 5
P/E cycles
—
— years
NOTES:
1 _{Typical endurance is evaluated at 25} o_{C. Product qualification is performed to the minimum specification. For}
additional information on the Freescale definition of Typical Endurance, please refer to Engineering Bulletin EB619,
Typical Endurance for Nonvolatile Memory.
2 _{Ambient temperature averaged over duration of application, not to exceed product operating temperature range.}
3.15.2
Read access timing
Table 28. Code flash read access timing
No. Symbol
Parameter
Condition
2 f_READ CC Maximum frequency for Flash reading
(system clock frequency SYS_CLK)
3
4 wait states
3 wait states
Table 29. Data flash read access timing
No. Symbol
Parameter
Condition
2 f_READ CC Maximum frequency for Flash reading
3
(system clock frequency SYS_CLK)
12 wait states
8 wait states
Value
Max
90
60
Unit
MHz
MHz
Value
Unit
Max
90 MHz
60 MHz
3.15.3
Write access timing
Table 30. Code flash write access timing
No. Symbol
Parameter
2 f_WRITE CC Maximum frequency for Flash writing
(system clock frequency SYS_CLK)
3
Condition
TBD
TBD
Value
Max
90
60
Unit
MHz
MHz
PXS30 Microcontroller Data Sheet, Rev. 1
88
Preliminary—Subject to Change Without Notice
Freescale Semiconductor