PXS30 Datasheet, PDF (75/139 Pages) Freescale Semiconductor, Inc – PXS30 Microcontroller

See Section 6, Reference documents, for more information.
Electrical characteristics
3.5.2 Test parameters
The following test parameters shall be used:
Table 14. EMC test parameters
Method
150 Ohm
TEM
Frequency Range
1 MHz to 1000 MHz
Receiver
BW
1 MHz
Step Size
500 kHz
In case of only narrow band disturbances the maximum of the results will not change. In case of broadband
signals the emission has to be below the limits.
3.6 Electrostatic discharge (ESD) characteristics
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of
each sample according to each pin combination. The sample size depends on the number of supply pins in
the device (3 parts × (n + 1) supply pin). This test conforms to the AEC-Q100-002/-003/-011 standard.
Table 15. ESD ratings^{1, 2}
No.
Symbol
Parameter
Conditions
Class Max value³ Unit
1
V_ESD(HBM) SR Electrostatic discharge T_A = 25 °C
H1C
2000
V
(Human Body Model) conforming to AEC-Q100-002
2
V_ESD(MM) SR Electrostatic discharge T_A = 25 °C
M2
200
V
(Machine Model)
conforming to AEC-Q100-003
3
V_ESD(CDM) SR Electrostatic discharge T_A = 25 °C
C3A 750 (corners) V
(Charged Device Model) conforming to AEC-Q100-011
500
NOTES:
1 _{All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated}
Circuits.
2 _{A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device}
specification requirements. Complete DC parametric and functional testing shall be performed per applicable
device specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
3 _{Data based on characterization results, not tested in production.}
3.7 Static latch-up (LU)
Two complementary static tests are required on six parts to assess the latch-up performance:
• A supply over voltage is applied to each power supply pin.
• A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with the EIA/JESD 78 IC latch-up standard.
PXS30 Microcontroller Data Sheet, Rev. 1
Freescale Semiconductor
Preliminary—Subject to Change Without Notice
75