PXS30 Datasheet, PDF (87/139 Pages) Freescale Semiconductor, Inc – PXS30 Microcontroller

3.15 Flash memory electrical characteristics
Electrical characteristics
3.15.1 Program/Erase characteristics
Table 25 shows the Code flash memory program and erase characteristics.
Table 25. Code flash program and erase electrical specifications
No.
Symbol
Parameter
Min
Typ¹
Initial
Max²
Lifetime
Max³
Unit
1 T_DWPROGRAM CC Double Word (64 bits) program time⁴
— 18 50
500 µs
3 T_16KPPERASE CC 16 KB block pre-program and erase time
— 200 500 5000 ms
4 T_32KPPERASE CC 32 KB block pre-program and erase time
— 300 600 5000 ms
5 T_64KPPERASE CC 64 KB block pre-program and erase time
— 400 900 5000 ms
6 T_128KPPERASE CC 128 KB block pre-program and erase time
— 600 1300 7500 ms
NOTES:
1 _{Typical program and erase times assume nominal supply values and operation at 25 °C. All times are subject to}
change pending device characterization.
2 _{Initial Max program and erase times provide guidance for time-out limits used in the factory and apply for < 100}
program/erase cycles, nominal supply values and operation at T_J = 25 °C. These values are verified at production
test.
3 _{Lifetime Max program and erase times apply across the voltage, temperature, and cycling range of product life.}
These values are characterized, but not tested.
4 _{Actual hardware programming times. This does not include software overhead.}
Table 26 shows the Data flash memory program and erase characteristics.
Table 26. Data flash program and erase electrical specifications
No.
Symbol
Parameter
Min
Typ¹
Initial
Max²
Lifetime
Max³
Unit
1 T_DWPROGRAM CC Double Word (64 bits) program time⁴
— 30 70
300 µs
3 T_16KPPERASE CC 16 KB block pre-program and erase time
— 700 800 1500 ms
NOTES:
1 _{Typical program and erase times assume nominal supply values and operation at 25 °C. All times are subject to}
change pending device characterization.
2 _{Initial Max program and erase times provide guidance for time-out limits used in the factory and apply for < 100}
program/erase cycles, nominal supply values and operation at T_J = 25 °C. These values are verified at production
test.
3 _{Lifetime Max program and erase times apply across the voltage, temperature, and cycling range of product life.}
These values are characterized, but not tested.
4 _{Actual hardware programming times. This does not include software overhead.}
PXS30 Microcontroller Data Sheet, Rev. 1
Freescale Semiconductor
Preliminary—Subject to Change Without Notice
87