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K4C89363AF Datasheet, PDF (11/58 Pages) Samsung semiconductor – 2,097,152-WORDS x 4 BANKS x 36-BITS DOUBLE DATA RATE Network-DRAM
K4C89363AF
AC Test Conditions
Symbol
V IH ( m i n )
VIL (max)
V REF
V TT
V SWING
VR
V ID ( A C )
SLEW
V OTR
Parameter
Input high voltage (minimum)
Input low voltage (maximum)
Input reference voltage
Termination voltage
Input signal peak to peak swing
Differential clock input reference level
Input differential voltage
Input signal minimum slew rate
Output timing measurement reference voltage
VddQ
Value
VREF + 0.2
VREF - 0.2
VddQ/2
VREF
0.7
VX(AC)
1.0
2.5
VddQ/2
V SWING
V IH min (AC)
VREF
Output
V IL m a x (AC)
25 Ω
Vss
∆T
∆T
Units
V
V
V
V
V
V
V
V/ns
V
Z=50Ω
Z=50Ω
Notes
9
V TT
50 Ω
50 Ω
V TT
S l e w = (V IH m i n ( A C ) - V ILm a x ( A C ) ) /∆ T
AC Test Load
N o t e s : 1 . T r a n s i t i o n t i m e s a r e m e a s u r e d b e t w e e n V I H m i n ( D C ) a n d V IL m a x (DC).
Transition (rise and fall) of input signals have a fixed slope.
2. If the result of nominal calculation with regard to tCK contains more than
one decimal place, the result is rounded up to the nearest decimal place.
(i.e., tDQSS = 0.8*tCK, tCK = 3.3ns, 0.8*3.3 ns = 2.64 ns is rounded up to 2.7 ns.)
3. These parameters are measured from the differential clock (CLK and C LK) AC cross point.
4. These parameters are measured from signal transition point of D S crossing V REF level.
5. The t REFI(MAX.) applies to equally distributed refresh method.
The t REFI(MIN.) applies to both burst refresh method and distributed refresh method.
In such case, the average interval of eight consecutive Auto-Refresh commands has to be more than 400ns always. In
other words, the number of Auto- Refresh cycles which can be performed within 3.2us (8X400ns) is to 8 times in the
maximum.
6. Low Impedance State is speified at VddQ/2± 0.2V from steady state.
7. High Impedance State is specified where output buffer is no longer driven.
8. These parameters depend on the clock jitter. These parameters are measured at stable clock.
9. Output timing is measured by using Normal driver strength.
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REV. 0.0 Nov. 2002