NP8P128A13BSM60E Datasheet, PDF (62/92 Pages) Numonyx B.V – 128-Mbit Parallel Phase Change Memory

Numonyx® Omneo™ P8P Datasheet
16.0 AC Characteristics
16.1
AC Test Conditions
Figure 19: AC Input/Output Reference Waveform
V_CCQ
0V
Input V_CCQ/2
Test Points
V_CCQ/2 Output
IO_REF.WMF
Note:
AC test inputs are driven at V_CCQ for Logic "1" and 0.0 V for Logic "0." Input/output
timing begins/ends at V_CCQ/2. Input rise and fall times (10% to 90%) < 5 ns. Worst
case speed occurs at V_CC = V_CCMin.
Figure 20: Transient Equivalent Testing Load Circuit
Device
Under Test
Out
C1
Table 28: Test configuration component value for worst case speed conditions
Test Configuration
V_CCQMIN
C_L (pF) (includes jig capacitance)
30
16.2
Capacitance
Table 29: Capacitance: T_A = +25°C, f = 1 MHz (Sampled, not 100% tested)
Symbol
Parameter⁽¹⁾
Min
Typ
Max
Unit
C_IN
C_OUT
Input Capacitance
2
6
8
pF
Output Capacitance
2
4
7
pF
Condition
V_IN = 0.0 V
V_OUT = 0.0 V
Datasheet
62
July 2010
316144-07