GR442QR7LB102KW01L Datasheet, PDF (196/237 Pages) Murata Manufacturing Co., Ltd. – chip monolithic ceramic capacitors

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GA3 Series Specifications and Test Methods
C02E.pdf
Oct.1,2012
No.
Item
Specifications
1
Operating
Temperature Range
2 Appearance
3 Dimensions
–55 to +125°C
No defects or abnormalities
Within the specified dimensions
4 Dielectric Strength No defects or abnormalities
5
*ՏÃiÊ6œÌ>}i
(Application: Type
GD/GF)
No self healing breakdowns or flash-overs have taken place in
the capacitor.
6
Insulation Resistance
(I.R.)
More than 6,000MΩ
Ç Capacitance
Within the specified tolerance
Dissipation
8 Factor (D.F.)
Q
Char.
X7R
SL
Specification
D.F.V0.025
QU400+20C*² (CF30pF)
QU1000
(CU30pF)
Capacitance
9 Temperature
Characteristics
Char.
Capacitance Change
X7R
Within ±15%
Temperature characteristic guarantee is –55 to +125°C
Char. Temperature Coefficient
SL
+350 to –1000ppm/°C
Temperature characteristic guarantee is +20 to +85°C
Appearance No defects or abnormalities
I.R.
More than 1,000MΩ
Discharge
10
Test
(Application:
Type GC)
Dielectric
Strength
In accordance with item No.4
Test Method
–
Visual inspection
Using calipers and micrometers
No failure should be observed when voltage in the table is
applied between the terminations for 60±1 sec., provided the
charge/discharge current is less than 50mA.
Type GB
Type GC/GD
Type GF
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DC1075V
AC1500V (r.m.s.)
AC2000V (r.m.s.)
10 impulses of alternating polarity are subjected.
(5 impulses for each polarity)
The interval between impulses is 60 sec.
Applied Pulse: 1.2/50μs
Applied Voltage: 2.5kVo-p
The insulation resistance should be measured with DC500±50V
and within 60±5 sec. of charging.
The capacitance/Q/D.F. should be measured at a frequency of
1±0.2kHz (SL char.: 1±0.2MHz) and a voltage of
AC1±0.2V (r.m.s.).
The capacitance measurement should be made at each step
specified in the Table.
Step
1
2
3
4
5
Temperature (°C)
25±2 (20±2 for SL char.)
Min. Operating Temp.±3
25±2 (20±2 for SL char.)
Max. Operating Temp.±2
25±2 (20±2 for SL char.)
SL char. :
The capacitance should be measured at even 85°C between
step 3 and step 4.
U*ÀiÌÀi>̓i˜ÌÊvœÀÊ8Ç,ÊV…>À°
Perform a heat treatment at 150Y ^W10 ⁰°C for 60±5 min. and then
let sit for 24±2 hrs. at room condition.*¹
As in Fig., discharge is made 50 times at 5 sec. intervals from
the capacitor (Cd) charged at DC voltage of specified.
R3
R1
10kV
V
Cd
Ct
R2
11
Adhesive Strength
of Termination
No removal of the terminations or other defect should occur.
Ct: Capacitor under test Cd: 0.001μF
R1: 1,000Ω R2: 100MΩ R3: Surge resistance
Solder the capacitor to the testing jig (glass epoxy board) shown
in Fig. 1.
Then apply 10N force in the direction of the arrow. The soldering
should be done using the reflow method and should be
conducted with care so that the soldering is uniform and free of
defects such as heat shock.
10N, 10±1s
Glass Epoxy Board
*1 "Room condition" Temperature: 15 to 35°C, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
*2 "C" expresses nominal capacitance value (pF).
Fig. 1
Continued on the following page.
178