1EDI2002AS_15 Datasheet, PDF (71/147 Pages) Infineon Technologies AG – Single Channel Isolated Driver for Inverter Systems AD Step

VGATE
VGATE2
VTOM2
EiceDRIVER™ SIL
1EDI2002AS
Protection and Diagnostics
VTOM1
VGATE1
time
Figure 3-7 Gate Monitoring Function: Timing Definition
The Gate Monitoring can be tested on system level by (for example) pulling the IGBT gate signal high while the
device issues a PWM Low command. This can be done for example in combination with the ASC function of
Infineon’s 1EBN100XAE “EiceDRIVER™ Boost” booster stage. It can then be verified that the reaction of the
device corresponds to the expected behavior.
3.4.3 Temperature Monitoring
The Temperature Monitoring functionality is summarized in Table 3-10:
Table 3-10 Temperature Monitoring Overview
Parameter
Short Description
Function
Warning in case of over-temperature.
Periodicity
Continuous.
Action in case of failure event Flag PER.OTER is set.
Programmability
No
In-System Testability
No
The device is equipped with an internal temperature sensor. In case the value measured by the internal sensor
temperature exceeds a given threshold, bit PER.OTER is set.
3.4.4 SPI Error Detection
The SPI Error Detection mechanisms are summarized in Table 3-11:
Table 3-11 SPI Error Detection Overview
Parameter
Short Description
Function
Non valid SPI command detection and notification.
Periodicity
Continuous.
Action in case of failure event Flag PER.SPIER is set.
Datasheet
71
Hardware Description
Rev. 3.1, 2015-07-30