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MC68HC705J2 Datasheet, PDF (70/82 Pages) Freescale Semiconductor, Inc – member of the low-cost
Freescale Semiconductor, Inc.
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11.5 DC Electrical Characteristics (VDD = 3.3 Vdc)
Table 11-4. DC Electrical Characteristics (VDD = 3.3 Vdc)
Characteristic
Symbol
Min
Typ
Max Unit
Output Voltage
Iload = 10.0 µA
Iload = –10.0 µA
Output High Voltage (Iload = –0.2 mA)
PA7–PA0, PB5–PB0
Output Low Voltage (Iload = 0.4 mA)
PA7–PA0, PB5–PB0
VOL
VOH
—
—
VDD – 0.1 —
0.1
—
V
VOH
VDD – 0.3 —
—
V
VOL
—
—
0.3
V
Input High Voltage
PA7–PA0, PB5–PB0, IRQ/VPP, RESET, OSC1
Input Low Voltage
PA7–PA0, PB5–PB0, IRQ/VPP, RESET, OSC1
Supply Current (See NOTES.)
Run
Wait
Stop
25 °C
–40 to +85 °C
VIH
0.7 × VDD
—
VDD
V
VIL
VSS
—
0.2 × VDD
V
—
1.3
2.0
mA
IDD
—
0.7
1.0
mA
—
1.0
20
µA
—
—
50
µA
I/O Ports High-Z Leakage Current
PA7–PA0, PB5–PB0
Ioz
—
—
±10
µA
Input Current
RESET, IRQ/VPP, OSC1
Capacitance
Ports (as input or output)
RESET, IRQ/VPP
Iin
—
—
±1
µA
Cout
—
—
12
pF
Cin
—
—
8
pF
NOTES:
1. Typical values at midpoint of voltage range, 25 °C only.
2. Run (operating) IDD and Wait IDD measured using external square wave clock source (fosc = 2 MHz), all
inputs 0.2 V from rail; no dc loads; less than 50 pF on all outputs; CL = 20 pF on OSC2.
3. Wait IDD and Stop IDD: all ports configured as inputs; VIL = 0.2 V, VIH = VDD – 0.2 V.
4. Stop IDD measured with OSC1 = VSS.
5. Standard temperature range is 0 °C to 70 °C.
6. OSC2 capacitance linearly affects Wait IDD .
TEST POINT
VDD
R2
C
R1
PINS
VDD R1
4.5 V 3.26 k
PA7–PA0, PB5–PB0
3.0 V 10.91 k
R2
2.38 k
6.32 k
C
50 pF
50 pF
Figure 11-1. Equivalent Test Load
11-4
ELECTRICAL SPECIFICATIONS
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Rev. 2