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LM3S6C11 Datasheet, PDF (785/828 Pages) Texas Instruments – Stellaris® LM3S6C11 Microcontroller
OBSOLETE: TI has discontinued production of this device.
Stellaris® LM3S6C11 Microcontroller
20.11 Flash Memory
20.12
20.13
Table 20-18. Flash Memory Characteristics
Parameter
Parameter Name
Min
Nom
Max
PECYC
Number of guaranteed program/erase cycles 15,000
before failurea
-
-
TRET
Data retention, -40˚C to +85˚C
10
TPROG
Word program time
-
TBPROG
Buffer program time
-
TERASE
Page erase time
-
TME
Mass erase time
-
a. A program/erase cycle is defined as switching the bits from 1-> 0 -> 1.
-
-
-
1
-
1
-
12
-
16
Unit
cycles
years
ms
ms
ms
ms
Input/Output Characteristics
Note: All GPIO signals are 5-V tolerant when configured as inputs except for PB0 and PB1, which
are limited to 3.6 V. See “Signal Description” on page 392 for more information on GPIO
configuration.
Table 20-19. GPIO Module Characteristicsa
Parameter Parameter Name
Min
Nom
Max
Unit
RGPIOPU GPIO internal pull-up resistor
100
-
300
kΩ
RGPIOPD
ILKG
GPIO internal pull-down resistor
GPIO input leakage currentb
GPIO rise time, 2-mA drivec
200
-
500
kΩ
-
-
2
µA
14
20
ns
TGPIOR
GPIO rise time, 4-mA drivec
GPIO rise time, 8-mA drivec
7
10
ns
-
4
5
ns
GPIO rise time, 8-mA drive with slew rate controlc
6
8
ns
GPIO fall time, 2-mA drived
14
21
ns
TGPIOF
GPIO fall time, 4-mA drived
GPIO fall time, 8-mA drived
7
11
ns
-
4
6
ns
GPIO fall time, 8-mA drive with slew rate controld
6
8
ns
a. VDD must be within the range specified in Table 20-2 on page 775.
b. The leakage current is measured with GND or VDD applied to the corresponding pin(s). The leakage of digital port pins is
measured individually. The port pin is configured as an input and the pullup/pulldown resistor is disabled.
c. Time measured from 20% to 80% of VDD.
d. Time measured from 80% to 20% of VDD.
Synchronous Serial Interface (SSI)
Table 20-20. SSI Characteristics
Parameter
No.
S1
S2
S3
Parameter Parameter Name
TCLK_PER
TCLK_HIGH
TCLK_LOW
SSIClk cycle timea
SSIClk high time
SSIClk low time
Min Nom Max
40
-
-
-
0.5
-
-
0.5
-
Unit
ns
t clk_per
t clk_per
July 24, 2012
785
Texas Instruments-Production Data