MSP430FR2033 Datasheet, PDF (60/89 Pages) Texas Instruments – Mixed-Signal Microcontrollers

MSP430FR2033, MSP430FR2032
SLASE45B – OCTOBER 2014 – REVISED AUGUST 2015
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6.10 Device Descriptors (TLV)
Table 6-28 lists the Device IDs of the MSP430FR203x device variants. Table 6-29 lists the contents of the
device descriptor tag-length-value (TLV) structure for MSP430FR203x devices.
Information Block
Die Record
ADC Calibration
DEVICE
MSP430FR2033
MSP430FR2032
Table 6-28. Device IDs
1A04h
75h
78h
DEVICE ID
1A05h
82h
82h
Table 6-29. Device Descriptors
Info length
CRC length
CRC value⁽¹⁾
DESCRIPTION
Device ID
Hardware revision
Firmware revision
Die Record Tag
Die Record length
Lot Wafer ID
Die X position
Die Y position
Test Result
ADC Calibration Tag
ADC Calibration Length
ADC Gain Factor
ADC Offset
ADC 1.5-V Reference Temperature 30°C
ADC 1.5-V Reference Temperature 85°C
MSP430FR203x
ADDRESS
VALUE
1A00h
06h
1A01h
06h
1A02h
per unit
1A03h
per unit
1A04h
1A05h
See Table 6-28
1A06h
per unit
1A07h
per unit
1A08h
08h
1A09h
0Ah
1A0Ah
per unit
1A0Bh
per unit
1A0Ch
per unit
1A0Dh
per unit
1A0Eh
per unit
1A0Fh
per unit
1A10h
per unit
1A11h
per unit
1A12h
per unit
1A13h
per unit
1A14h
11h
1A15h
08h
1A16h
per unit
1A17h
per unit
1A18h
per unit
1A19h
per unit
1A1Ah
per unit
1A1Bh
per unit
1A1Ch
per unit
1A1Dh
per unit
(1) The CRC value covers the checksum from 1A04h to 1A77h by applying the CRC-CCITT-16 polynomial of x¹⁶ + x¹² + x⁵ + 1.
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Detailed Description
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