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SAB80515 Datasheet, PDF (251/270 Pages) Siemens Semiconductor Group – 8-Bit Single-Chip Microcontroller Family
Device Specifications
Notes for page 249 and 250:
1) Capacitive loading on ports 0 and 2 may cause spurious noise pulses to be
superimposed on the VOL of ALE and ports 1, 3, 4 and 5. The noise is due to external bus
capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0
transitions during bus operation.
In the worst case (capacitive loading > 100 pF), the noise pulse on ALE line may
exceed 0.8 V.
Then, it may be desirable to qualify ALE with a Schmitttrigger, or use an address latch
with a Schmitttrigger strobe input.
2) Capacitive loading on ports 0 and 2 may cause the VOH on ALE and PSEN to
momentarily fall below the 0.9 VCC specification when the address bits are stabilizing.
3) Power-down ICC is measured with: EA = Port 0 = Port 6 = VCC;
XTAL1 = N.C.; XTAL2 = VSS; RESET = VCC; VAGND = VSS; all other pins are disconnected.
4) ICC(active mode) is measured with: XTAL2 driven with the clock signal according
to the figure below; XTAL1 = N.C.; EA = Port 0 = Port 6 = VCC; RESET = VSS; all other
pins are disconnected. ICC might be slightly higher if a crystal oscillator is used.
5) ICC (idle mode) is measured with: XTAL2 driven with the clock signal according to the
figure below; XTAL1 = N.C.; EA = VSS; Port 0 = Port 6 VCC; RESET = VCC; all other pins are
disconnected; all on-chip peripherals are disabled.
6) ICC at other frequencies is given by:
Active mode: ICC max (mA) = 2.67 × fOSC (MHz) + 3.00
Idle mode: ICC max (mA) = 0.88 × fOSC (MHz) + 2.50
where fOSC is the oscillator frequency in MHz.
ICC max is given in mA and measured at VCC = 5 V (see also notes 4 and 5)
Semiconductor Group
251