4583 Datasheet, PDF (147/153 Pages) Renesas Technology Corp – SINGLE-CHIP 4-BIT CMOS MICROCOMPUTER

4583 Group
PRELIMINARY
Notice: This is not a final specification.
Some parametric limits are subject to change.
A/D CONVERTER CHARACTERISTICS
(Ta = –20 °C to 85 °C, unless otherwise noted)
Symbol
Parameter
Test conditions
Limits
Unit
Min.
Typ.
Max.
–
Resolution
10
bits
–
Linearity error
2.7 (3.0) V ≤ VDD ≤ 5.5 V ((): One Time PROM version)
±2
LSB
Mask ROM version
2.2 V ≤ VDD < 2.7 V
±4
–
Differential non-linearity error 2.2 (3.0) V ≤ VDD ≤ 5.5 V ((): One Time PROM version)
±0.9 LSB
V0T
Zero transition voltage
Mask ROM version
VDD = 5.12 V
0
10
20
mV
VDD = 3.072 V
0
7.5
15
VDD = 2.56 V
0
7.5
15
One Time PROM version VDD = 5.12 V
0
15
30
VFST Full-scale transition voltage Mask ROM version
VDD = 3.072 V
VDD = 5.12 V
3
5105
13
5115
23
5125 mV
VDD = 3.072 V
3064.5
3072
3079.5
VDD = 2.56 V
2552.5
2560
2567.5
One Time PROM version VDD = 5.12 V
5100
5115
5130
–
Absolute accuracy
Mask ROM version
VDD = 3.072 V
2.0 V ≤ VDD < 2.2 V
3065
3075
3085
±8
LSB
IADD
(Quantization error excluded)
A/D operating current
VDD = 5 V
150
450
µA
(Note 1)
TCONV A/D conversion time
VDD = 3 V
f(XIN) = 6 MHz
75
225
31
µs
f(STCK) = f(XIN) (XIN through mode)
ADCK=INSTCK/6
–
Comparator resolution
–
Comparator error (Note 2) Mask ROM version
VDD = 5.12 V
VDD = 3.072 V
8
bits
±20
mV
±15
VDD = 2.56 V
One Time PROM version VDD = 5.12 V
VDD = 3.072 V
–
Comparator comparison time f(XIN) = 6 MHz
±15
±30
±23
4
µs
f(STCK) = f(XIN) (XIN through mode)
ADCK=INSTCK/6
Notes 1: When the A/D converter is used, IADD is added to IDD (supply current).
2: As for the error from the ideal value in the comparator mode, when the contents of the comparator register is n, the logic value of the comparison
voltage Vref which is generated by the built-in DA converter can be obtained by the following formula.
Logic value of comparison voltage Vref
VDD
Vref =
✕n
256
n = Value of register AD (n = 0 to 255)
Rev.3.00 Aug 06, 2004 page 147 of 151
REJ03B0009-0300Z