MC9S08LC60 Datasheet, PDF (349/358 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics
Parameter
Table A-15. Conducted Transient Susceptibility
Symbol
Conditions
f_OSC/f_CPU
Result
Amplitude⁽¹⁾
(Min)
Unit
A
TBD
Conducted susceptibility,
V_DD = TBD
B
electrical fast transient/burst
V_{CS_EFT}
T_A = +25^oC
TBD
(EFT/B)
package type
C
TBD
kV
TBD
D
TBD
A
TBD
Conducted susceptibility,
electrostatic discharge (ESD)
V_{CS_ESD}
V_DD = TBD
T_A = +25^oC
package type
TBD
B
C
TBD
kV
TBD
D
TBD
1 _{Data based on qualification test results. Not tested in production.}
2. These pins demonstrate particularly low levels of performance:
The susceptibility performance classification is described in Table A-16.
Table A-16. Susceptibility Performance Classification
Result
A
B
Performance Criteria
No failure
The MCU performs as designed during and after exposure.
Self-recovering The MCU does not perform as designed during exposure. The MCU returns
failure
automatically to normal operation after exposure is removed.
C
Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D
Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E
Damage
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
MC9S08LC60 Series Advance Information Data Sheet, Rev. 2
Freescale Semiconductor
PRELIMINARY
349