MC9S08LC60 Datasheet, PDF (348/358 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics
A.12 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
A.12.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East). For more detailed information concerning the evaluation results, conditions
and setup, please refer to the EMC Evaluation Report for this device.
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal
to the reported emissions levels.
Table A-14. Radiated Emissions
Parameter
Symbol Conditions
Frequency
f_osc/f_CPU
Level⁽¹⁾
(Max)
Unit
Radiated emissions,
electric field
— Conditions - TBD
V_{RE_TEM}
V_DD = TBD
T_A = +25^oC
package type
0.15 – 50 MHz
50 – 150 MHz
150 – 500 MHz
500 – 1000 MHz
IEC Level
SAE Level
TBD
TBD
TBD
TBD
TBD
TBD
TBD
dBµV
—
—
1 _{Data based on qualification test results.}
A.12.2 Conducted Transient Susceptibility
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology are in accordance with IEC
61000-4-2 (ESD) and IEC 61000-4-4 (EFT/B). The transient voltage required to cause performance
degradation on any pin in the tested configuration is greater than or equal to the reported levels unless
otherwise indicated by footnotes below the table.
MC9S08LC60 Series Advance Information Data Sheet, Rev. 2
348
PRELIMINARY
Freescale Semiconductor