LM3S1N16 Datasheet, PDF (171/794 Pages) Texas Instruments – Stellaris® LM3S1N16 Microcontroller

Stellaris^® LM3S1N16 Microcontroller
4.5.2.1
IDCODE Data Register
The format for the 32-bit IDCODE Data Register defined by the IEEE Standard 1149.1 is shown in
Figure 4-3. The standard requires that every JTAG-compliant microcontroller implement either the
IDCODE instruction or the BYPASS instruction as the default instruction. The LSB of the IDCODE
Data Register is defined to be a 1 to distinguish it from the BYPASS instruction, which has an LSB
of 0. This definition allows auto-configuration test tools to determine which instruction is the default
instruction.
The major uses of the JTAG port are for manufacturer testing of component assembly and program
development and debug. To facilitate the use of auto-configuration debug tools, the IDCODE
instruction outputs a value of 0x4BA0.0477. This value allows the debuggers to automatically
configure themselves to work correctly with the Cortex-M3 during debug.
Figure 4-3. IDCODE Register Format
31
28 27
TDI
Version
Part Number
12 11
Manufacturer ID
10
1 ^TDO
4.5.2.2
BYPASS Data Register
The format for the 1-bit BYPASS Data Register defined by the IEEE Standard 1149.1 is shown in
Figure 4-4. The standard requires that every JTAG-compliant microcontroller implement either the
BYPASS instruction or the IDCODE instruction as the default instruction. The LSB of the BYPASS
Data Register is defined to be a 0 to distinguish it from the IDCODE instruction, which has an LSB
of 1. This definition allows auto-configuration test tools to determine which instruction is the default
instruction.
Figure 4-4. BYPASS Register Format
0
TDI ₀ TDO
4.5.2.3
Boundary Scan Data Register
The format of the Boundary Scan Data Register is shown in Figure 4-5. Each GPIO pin, starting
with a GPIO pin next to the JTAG port pins, is included in the Boundary Scan Data Register. Each
GPIO pin has three associated digital signals that are included in the chain. These signals are input,
output, and output enable, and are arranged in that order as shown in the figure.
When the Boundary Scan Data Register is accessed with the SAMPLE/PRELOAD instruction, the
input, output, and output enable from each digital pad are sampled and then shifted out of the chain
to be verified. The sampling of these values occurs on the rising edge of TCK in the Capture DR
state of the TAP controller. While the sampled data is being shifted out of the Boundary Scan chain
in the Shift DR state of the TAP controller, new data can be preloaded into the chain for use with
the EXTEST and INTEST instructions. The EXTEST instruction forces data out of the controller,
and the INTEST instruction forces data into the controller.
January 21, 2012
171
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