English
Language : 

K4J52324QC Datasheet, PDF (22/57 Pages) Samsung semiconductor – 512Mbit GDDR3 SDRAM
K4J52324QC-B
512M GDDR3 SDRAM
SCAN DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
PARAMETER/CONDITON
Input High (Logic 1) Voltage
Input Low (Logic 0) Voltage
*Note : 1. The parameter applies only when SEN is asserted.
2. All voltages referenced to GND.
SYMBOL
VIH(DC)
VIL(DC)
MIN
VREF+0.15
-
MAX
-
VREF-0.15
UNITS
V
V
NOTES
1,2
1,2
SCK
SEN
SSH LOW
SOE
Pins
under Test
Figure 2. Scan Capture Timing
Not a true clock, but a single pulse or series of pulses
tSES
tSCS
tSDS tSDS
VALID
DON’T CARE
SCK
SEN
SSH
SOE
SOUT
Figure 3.Scan Shift Timing
tSES
tSCS
tSCS
tSAC
Scan Out
bit 0
tSOH
Scan Out
bit 1
Scan Out
bit 2
Scan Out
bit 3
TRANSITIONING DATA
- 22 -
Rev 1.0 (Mar 2005)