BUK3F00-50WDXX Datasheet, PDF (39/52 Pages) NXP Semiconductors – Controller for TrenchPLUS FETs

NXP Semiconductors
BUK3F00-50WDxx
Controller for TrenchPLUS FETs
Table 31. Pulse-width modulation characteristics
V_BAT = V_CC(MOD) = 13 V; typical values are given at T_amb = 25 °C; limit values are given at T_case = −40 °C to +125 °C; unless
otherwise specified.
Symbol
Parameter
Conditions
Min
Typ Max Unit
Pulse-width modulator
∆f_PWM/f_PWM relative PWM frequency variation
PWM input: pin INP
[1] _−20
-
+20 %
V_IL
LOW-level input voltage
V_IH
HIGH-level input voltage
V_hys(I)
input hysteresis voltage
V_CL(i)
input clamping voltage
C_in
input capacitance
R_pd
pull-down resistance
PWM output: pin PWMMON
1
-
-
V
-
-
2
V
200
-
700
mV
9.5
10.5 11.5 V
-
10
-
pF
50
100
250
kΩ
V_OL
V_OH(log)(ext)
LOW-level output voltage
external logic HIGH-level output
voltage
I_I = 1.6 mA
I_O = 1 mA
-
-
V_CC(LOG)EXT − 0.4 -
0.4
V
-
V
[1] Relative PWM frequency error includes clock frequency variation.
Table 32. Current measurement characteristics
V_BAT = V_CC(MOD) = 13 V; typical values are given at T_amb = 25 °C; limit values are given at T_case = −40 °C to +125 °C; unless
otherwise specified.
Symbol Parameter
Conditions
Min Typ Max Unit
Current measurement^[1]
E_ADC(I) ADC error (current)
all ranges; R_IREFCURR = 24.9 kΩ
0.01 × I_{meas(ADC)(fs)}
0.20 × I_{meas(ADC)(fs)}
0.80 × I_{meas(ADC)(fs)}
type 50WDFE
[2]
[3] _−2
-
−4
-
−11 -
+2
bit
+4
bit
+15 bit
other 50WDxx types
−13 -
+13 bit
I_O(meas)
measure output current
all ranges; V_CC(MEASC) = 5 V; R_IMEAS = 4.7 kΩ;
R_IREFCURR = 24.9 kΩ
0.00 × I_{meas(ADC)(fs)}
0.20 × I_{meas(ADC)(fs)}
1.00 × I_{meas(ADC)(fs)}
8.00 × I_{meas(ADC)(fs)}
-
0
5
µA
15
20
25
µA
92.5 102.5 112.5 µA
660 820 980 µA
[1] If measured without a FET, then connect a suitable resistor between pins V_BAT and SENSE to ensure stability.
[2] ADC accuracy ensured when V_BAT and V_CC(MOD) > 9 V.
[3] ADC used at this level for on-state open-circuit detection.
BUK3F00-50WDXX_4
Product data sheet
Rev. 04 — 4 September 2008
© NXP B.V. 2008. All rights reserved.
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