CLRC663 Datasheet, PDF (32/132 Pages) NXP Semiconductors – Contactless reader IC

NXP Semiconductors
CLRC663
Contactless reader IC
used, the TDO pin is placed in an inactive drive state when not actively shifting out data.
Because TDO can be connected to the TDI of another controller in a daisy-chain
configuration, the IEEE Standard 1149.1 expects the value on TDO to change on the
falling edge of TCK.
8.4.6.6 Data register
According to the IEEE1149.1 standard there are two types of data register defined:
bypass and boundary scan
The bypass register enable the possibility to bypass a device when part of the scan
path.Serial data is allowed to be transferred through a device from the TDI pin to the TDO
pin without affecting the operation of the device.
The boundary scan register is the scan-chain of the boundary cells. The size of this
register is dependent on the command.
8.4.6.7 Boundary scan cell
The boundary scan cell opens the possibility to control a hardware pin independent of its
normal use case. Basically the cell can only do one of the following: control, output and
input.
IC1
IC2
Boundary scan cell
TDI
TDO
TAP
TCK TMS
TDI
TDO
TAP
TCK TMS
Fig 24. Boundary scan cell path structure
001aam306
8.4.6.8 Boundary scan path
This chapter shows the boundary scan path of the CLRC663.
Table 26. Boundary scan path of the CLRC663
Number (decimal) Cell
Port
23
BC_1
-
22
BC_8
CLKOUT
21
BC_1
-
20
BC_8
SCL2
19
BC_1
-
18
BC_8
SDA2
17
BC_1
-
16
BC_8
IFSEL0
15
BC_1
-
14
BC_8
IFSEL1
Function
Control
Bidir
Control
Bidir
Control
Bidir
Control
Bidir
Control
Bidir
CLRC663
Product data sheet
COMPANY PUBLIC
All information provided in this document is subject to legal disclaimers.
Rev. 3.3 — 3 April 2012
171133
© NXP B.V. 2012. All rights reserved.
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