TLE94106EL Datasheet, PDF (9/75 Pages) Infineon Technologies AG – Six half bridge power outputs

TLE94106EL
General Product Characteristics
3
General Product Characteristics
3.1
Absolute Maximum Ratings
Table 2 Absolute Maximum Ratings¹⁾T_j = -40°C to +150°C
Parameter
Symbol
Values
Min. Typ. Max.
Unit Note or
Test Condition
Voltages
Supply voltage
Supply Voltage Slew Rate
V_S
-0.3 – 40
| dV_S/dt | –
– 10
V
V_S = V_S1 = V_S2
V/µs V_S increasing and
decreasing ¹⁾
Power half-bridge output voltage V_OUT
-0.3 –
Logic supply voltage
V_DD
-0.3 –
Logic input voltages
(SDI, SCLK, CSN, EN)
V_SDI,
-0.3 –
V_SCLK,
V_CSN, V_EN
Logic output voltage
(SDO)
V_SDO
-0.3 –
Currents
40 V
5.5 V
VDD V
VDD V
0 V < V_OUT < V_S
0 V < V_S < 40 V
0 V < V_S < 40 V
0 V < V_DD < 5.5V
0 V < V_S < 40 V
0 V < V_DD < 5.5V
Continuous Supply Current for V_S1 I_S1
Continuous Supply Current for V_S2 I_S2
Current per GND pin
I_GND
Output Currents
I_OUT
Temperatures
0
– 1.5 A –
0
– 1.5 A –
0
– 2.0 A –
-2.0 – 2.0 A –
Junction temperature
Storage temperature
ESD Susceptibility
T_j
-40 – 150 °C –
T_stg
-50 – 150 °C –
ESD susceptibility OUTn and VSx V_ESD
pins versus GND. All other pins
-8 – 8
kV JEDEC HBM¹⁾²⁾
grounded.
ESD susceptibility all pins
V_ESD
-2 –
ESD susceptibility all pins
V_ESD
-500 –
ESD susceptibility corner pins
V_ESD
-750 –
1) Not subject to production test, specified by design
2
kV JEDEC HBM¹⁾²⁾
500 V
CDM¹⁾³⁾
750 V
CDM¹⁾³⁾
2) ESD susceptibility, “JEDEC HBM” according to ANSI/ ESDA/ JEDEC JS001 (1.5 kΩ, 100pF)
3) ESD susceptibility, Charged Device Model “CDM” according JEDEC JESD22-C101
Number
P_4.1.1
P_4.2.2
P_4.1.2
P_4.1.3
P_4.1.4
P_4.1.5
P_4.1.6
P_4.1.7
P_4.1.14
P_4.1.15
P_4.1.8
P_4.1.9
P_4.1.10
P_4.1.11
P_4.1.12
P_4.1.13
Notes
1. Stresses above the ones listed here may cause permanent damage to the device. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
Data Sheet
9
1.0
2016-09-08