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HYB25D256161CE Datasheet, PDF (56/72 Pages) Infineon Technologies AG – 16M x 16 Double Data Rate Graphics DRAM
HYB25D256161CE-[4/5]
256-Mbit Double Data Rate SGRAM
Electrical Characteristics
Table 18 Electrical Characteristics and AC Timing - Absolute Specifications –4/–5 1) (cont’d)
Parameter
Symbol
–4
–5
Unit Note/Test Condition
DQS falling edge to CK setup time (write tDSS
cycle)
DQS falling edge hold time from CK
tDSH
(write cycle)
Mode register set command cycle time
Write preamble setup time
Write postamble
Write preamble
Address and control input setup time
Address and control input hold time
Read preamble
Read postamble
Active to Precharge command
Active to Active/Auto-refresh command
period
tMRD
tWPRES
tWPST
tWPRE
tIS
tIH
tRPRE
tRPST
tRAS
tRC
Auto-refresh to Active/Auto-refresh
tRFC
command period
Active to Read delay
Active to Write delay
Precharge command period
Active to Autoprecharge delay
Active bank A to Active bank B
command
tRCDRD
tRCDWR
tRP
tRAP
tRRD
Write recovery time
tWR
Auto precharge write recovery +
tDAL
precharge time
Internal write to read command delay
Exit self-refresh to non-read command
Exit self-refresh to read command
Average Periodic Refresh Interval
tWTR
tXSNR
tXSRD
tREFI
Min.
0.2
0.2
2
0
0.40
0.25
0.6
0.6
0.9
0.4
36
52
60
16
12
16
16
8
15
28
1
75
200
—
Max. Min.
—
0.2
—
0.2
—
2
—
0
0.60 0.40
—
0.25
—
0.6
—
0.6
1.1 0.9
0.6 0.4
70E+3 40
—
55
—
65
—
20
—
15
—
20
—
20
—
10
—
15
—
35
—
1
—
75
—
200
7.8 —
Max.
—
tCK
—
tCK
—
tCK
—
ns
0.60 tCK
—
tCK
—
ns
—
ns
1.1
tCK
0.6
tCK
70E+3 ns
—
ns
—
ns
—
ns
—
—
ns
—
ns
—
ns
—
ns
—
tCK
—
tCK
—
ns
—
tCK
7.8 µs
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1) 0 °C ≤ TA ≤ 70 °C; VDDQ = 2.6 V ± 0.1 V, VDD = +2.6 V ± 0.1 V
2) Input slew rate ≥ 1 V/ns
3) The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference
level for signals other than CK/CK, is VREF. CK/CK slew rate are ≥ 1.0 V/ns.
4) Inputs are not recognized as valid until VREF stabilizes.
5) The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (note 3) is VTT.
6) These parameters guarantee device timing, but they are not necessarily tested on each device.
7) tHZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred
to a specific voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).
8) The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before this CK edge.
A valid transition is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were
previously in progress on the bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress,
DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS.
Datasheet
56
Rev.1.0, 2004-02