33889 Datasheet, PDF (7/60 Pages) Freescale Semiconductor, Inc – System Basis Chip with Low Speed Fault Tolerant CAN Interface

ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 3. Maximum Ratings (continued)
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Max
Unit
ESD voltage (HBM 100 pF, 1.5 k) ⁽³⁾
CANL, CANH, HS1, L0, L1
RTH, RTL
All other pins
ESD voltage (Machine Model) All pins, MC33889B ^{(3) (4)}
ESD voltage (CDM) All pins, MC33889D ⁽⁴⁾
Pins 1,14,15, & 28
All other pins
V_ESDH
kV
±4.0
±3.0
±2.0
V_ESD-MM
±200
V
V_ESD-CDM
V
750
500
RTH, RTL Termination Resistance
R_T
500 to 16000
ohms
THERMAL RATINGS
Junction Temperature
T_J
-40 to 150
°C
Storage Temperature
T_S
-55 to 165
°C
Ambient Temperature (for info only)
Thermal resistance junction to gnd pin ⁽⁵⁾
T_A
R_THJ/P
-40 to 125
20
°C
°C/W
Notes:
3. Testing done in accordance with the Human Body Model (CZAP=100 pF, RZAP=1500 ), Machine Model (CZAP=200 pF, RZAP=0 ).
4. ESD machine model (MM) is for MC33889B only. MM is now replaced by CDM (Charged Discharged model).
5. Gnd pins 6,7,8,9,20, 21, 22, 23.
LX
Gnd
1nF
10 k
Transient Pulse
Generator
(note)
Gnd
Note: Waveform in accordance to ISO7637 part1, test pulses 1, 2, 3a and 3b.
Figure 3. Transient test pulse for L0 and L1 inputs
Analog Integrated Circuit Device Data
Freescale Semiconductor
33889
7