33889 Datasheet, PDF (19/60 Pages) Freescale Semiconductor, Inc – System Basis Chip with Low Speed Fault Tolerant CAN Interface

ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics (continued)
V_SUP From 5.5 V to 18 V, V2INT from 4.75 to 5.25 V and T_J from -40°C to 150°C unless otherwise noted. Typical values
noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Conditions
Symbol
Min
Typ
Max
Unit
Delay between SPI and “CAN normal mode”
SBC Normal mode ⁽²⁴⁾
t_S-CANN
-
-
10
µs
Delay between SPI and “CAN sleep mode”
SBC Normal mode ⁽²⁴⁾
t_S-CANS
-
-
10
µs
Delay between CS wake-up (CS low to high) and SBC
normal request mode (V_DD1 on & reset high)
SBC in stop mode
t_W-CS
15
40
90
µs
Delay between CS wake-up (CS low to high) and first
accepted SPI command
SBC in stop mode
t_W-SPI
90
-
-
µs
Delay between INT pulse and 1st SPI command accepted
t_S-1STSPI
20
-
In stop mode after wake-up
-
µs
Delay between two SPI messages addressing the same
register
For 33889D only
t2_SPI
25
-
µs
-
INPUT PINS (L0 AND L1)
Wake-up Filter Time (enable/disable option on L0 input)
(If filter enabled)
t_WUF
8.0
20
38
µs
PIN AC CHARACTERISTICS (CANH, CANL, RX, TX)
CANL and CANH Slew Rates (25% to 75% CAN signal). ⁽²⁵⁾
t_SLDR
Recessive to Dominant state
2.0
2.0
Dominant to Recessive state
V/µs
8.0
9.0
Propagation Delay
TX to RX Low. -40°C < T ≤ 25°C. ⁽²⁶⁾
TX to RX Low. 25°C < T < 125°C. ⁽²⁶⁾
t_ONRX
Propagation Delay TX to RX High. ⁽²⁶⁾
t_OFFRX
Notes
24. Guaranteed by design
25. Dominant to recessive slew rate is dependant upon the bus load characteristics.
26. AC Characteristics measured according to schematic Figure 4
µs
1.2
1.6
1.1
1.8
1.8
2.2
µs
Analog Integrated Circuit Device Data
Freescale Semiconductor
33889
19