33889 Datasheet, PDF (16/60 Pages) Freescale Semiconductor, Inc – System Basis Chip with Low Speed Fault Tolerant CAN Interface

ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics
V_SUP From 5.5 V to 18 V, V2INT from 4.75 to 5.25 V and T_J from -40°C to 150°C unless otherwise noted. Typical values
noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Conditions
Symbol
Min
Typ
Max
Unit
DIGITAL INTERFACE TIMING (SCLK, CS, MOSI, MISO)
SPI operation frequency
FREQ
-
-
4.0
MHz
SCLK Clock Period
SCLK Clock High Time
SCLK Clock Low Time
Falling Edge of CS to Rising
Edge of SCLK
t_PCLK
250
-
t_WSCLKH
125
-
t_WSCLKL
125
-
t_lLEAD
100
50
-
ns
-
ns
-
ns
-
ns
Falling Edge of SCLK to Rising Edge of CS
MOSI to Falling Edge of SCLK
Falling Edge of SCLK to MOSI
MISO Rise Time (CL = 220 pF)
MISO Fall Time (CL = 220 pF)
Time from Falling or Rising Edges of CS to:
- MISO Low Impedance
- MISO High Impedance
Time from Rising Edge of SCLK to MISO Data Valid
0.2 V1 ≤ SO ≥ 0.8 V1, C_L = 200 pF
t_LAG
t_SISU
t_SIH
t_RSO
t_fSO
t_SOEN
t_SODIS
t_VALID
100
50
40
25
40
25
-
25
-
25
-
-
-
-
-
ns
-
ns
-
ns
50
ns
50
ns
ns
50
50
50
ns
Delay between CS low to high transition (at end of SPI stop
command) and Stop or sleep mode activation ⁽²¹⁾
T_CS-STOP
18
-
34
µs
detected by V2 off
Interrupt low level duration
SBC in stop mode
T_INT
7.0
10
13
µs
Internal oscillator frequency
All modes except Sleep and Stop ⁽²¹⁾
O_SC-F1
-
100
-
kHz
Notes
21. Guaranteed by design
33889
16
Analog Integrated Circuit Device Data
Freescale Semiconductor