33889 Datasheet, PDF (21/60 Pages) Freescale Semiconductor, Inc – System Basis Chip with Low Speed Fault Tolerant CAN Interface

ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics (continued)
V_SUP From 5.5 V to 18 V, V2INT from 4.75 to 5.25 V and T_J from -40°C to 150°C unless otherwise noted. Typical values
noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Conditions
Symbol
Min
Typ
Max
Unit
Edge Count Difference Between CANH and CANL for Failures
1, 2, 5 Detection (Failure bit set, Normal Mode)
Edge Count Difference Between CANH And CANL For
Failures 1, 2, 5 Recovery (Normal Mode)
TX Permanent Dominant Timer Disable Time
(Normal Mode And Failure Mode)
TX Permanent Dominant Timer Enable Time
(Normal Mode And Failure Mode)
E_CDF
E_CDR
t_TX,D
t_TX,E
3
3
0.75
10
4.0
ms
60
µs
CANL
CANH
VDD
R
C
C
R = 100ohms
C = 1nF
R
C
RtL
Tx
CANL
MC33889D
Rx CANH
RtH
5V
500 RcanL
500 RcanH
1nF
1nF
Figure 4. Test Circuit for AC Characteristics
RtL
Tx
CANL
MC33889D
Rx CANH
RtH
500
500
RcanL = RcanH = 125 ohms
Figure 5. ISO loop time without bus failure
Vbat
RcanL
1nF
Bus
Failure
Generator (*)
RcanH
1nF
RcanL = RcanH = 125 ohms
except for failure CANH short to CANL
(Rcanl = 1M ohms)
(*) List of failure
CANL short to gnd, Vdd, Vbat
CANHshort to gnd, Vdd, Vbat
CANL short to CANH
CANL and CANH open
Figure 6. ISO Loop Time with Bus Failure
Analog Integrated Circuit Device Data
Freescale Semiconductor
33889
21